Hitachi Global Storage Technologies Netherlands B.v.

Hgst Netherlands, B.v.

Other

Qi-Fan Xiao

Kai Tang

Xiaoping Bian

Mary Frances Doerner

Yoshihiro Ikeda

Kentaro Takano

Mary Frances Minardi

Bruno Jean Marchon

Qing Dai

David Thomas Margulies

Hoa Van Do

Ning Shi

Mohammad Taghi Mirzamaani

Natacha Frederique Supper

Daryl J Pocker

Eric Wayne Flint

Franck Rose

Adam Polcyn

Min Xiao

Mark F Mercado

Mohammad S Mirzamaani

Fabrication methods for magnetic recording media that use a plasma polish are disclosed. For one exemplary method, a film of a magnetic recording medium is deposited, and a top surface of the film is polished utilizing a plasma formed by a noble gas to smoothen the top surface of the film. A subsequent layer is then deposited onto the polished top surface of the film. A top surface of the subsequent layer has a reduced roughness by being deposited on the polished top surface of the film.

Plasma polish for magnetic recording media

A method for applying a protective layer to an electronic device such as the ABS of a slider, magnetic head, etc. for reducing paramagnetic deadlayer thickness includes selecting an etching angle for minimizing formation of a paramagnetic deadlayer at an interface of an electronic device and an adhesive layer subsequently formed on the electronic device, etching a surface of an electronic device at the selected angle, the selected angle being less than about 75 degrees from an imaginary line extending perpendicular to the surface, forming an adhesive layer on the etched surface of the electronic device, and forming a protective layer on the adhesive layer. A magnetic head formed by the process is also disclosed.

Method for minimizing magnetically dead interfacial layer during COC process

A magnetic media disk has a substrate; a recording magnetic media on the substrate; and an overcoat on the recording magnetic media, the overcoat comprising a Si-based layer on the recording magnetic media, and a Ti-based layer on the Si-based layer. The magnetic media disk may be rotatably mounted to an enclosure in a hard disk drive.

Magnetic media disk anticorrosion overcoat with titanium and silicon based layers

An improved structure for the construction of perpendicular recording media is disclosed. The structure includes a perpendicular recording layer with at least two oxide sublayers or a lower sublayer of a non-oxide. One structure includes an upper sublayer comprised of a Silicon-oxide, while a lower sublayer is comprised of a Tantalum-oxide. The structures provide for increased coercivity and corrosion resistance.

Oxide magnetic recording layers for perpendicular recording media

Perpendicular magnetic recording media and methods of fabricating perpendicular magnetic recording media are described. The perpendicular magnetic recording medium of one embodiment includes an interlayer, an underlayer, and a perpendicular magnetic recording layer. The interlayer is comprised of a Ni-alloy having the characteristics of being nonmagnetic and having an FCC structure. The alloying element for the Ni-alloy may comprise one of V or Cr, or may comprise one of V, Cr, or W. The concentration of the alloying element is set such that the concentration of the alloying element is high enough to make the Ni-alloy non-magnetic, while low enough to maintain an FCC structure for the Ni-alloy.

Perpendicular magnetic recording medium having an interlayer of a non-magnetic nickel alloy

The applicants disclose a thin film magnetic media structure with a pre-seed layer of CrTiAl. The CrTiAl pre-seed layer presents an amorphous or nanocrystalline structure. The CrTiAl pre-seed layer improves in-plane c-axis orientation while maintaining a good orientation ratio. The pulse transition width (PW50) is narrowed and the soft error rate is improved. The preferred seed layer is RuAl.

Magnetic thin film media with a pre-seed layer of CrTiAl

A thin film structure for a magnetic thin film recording medium including a dual seed layer of RuAl/NiAlB is disclosed. The use of the RuAl/NiAlB structure provides reduced grain size, an increased Mrt orientation ratio (OR), increased SNR and lower PW50 at higher amplitude. The RuAl and NiAlB seed layers each have a B2 crystallographic structure. The RuAl/NiAlB dual seed layer can be used to obtain an underlayer with a preferred in-plane orientation of (200) and a cobalt alloy magnetic film with the preferred in-plane orientation of (11{overscore ( )}20).

Thin film media with a dual seed layer of RuAI/NiAIB

A thin film magnetic media structure with a bi-layer structure of amorphous chromium titanium (CrTi) followed by an amorphous layer of nickel phosphorus (NiP) is disclosed. After the NiP has been deposited it is exposed to oxygen to form an oxidized surface. Preferably the underlayer is deposited directly onto the oxidized NiP surface. The bi-layer structure of CrTi/NiP promotes excellent in-plane crystallographic orientation in the cobalt alloy magnetic layer(s) and allows an ultra-thin chromium underlayer to be used which provides better control over grain size and distribution. When the CrTi/NiP bi-layer structure is combined with a circumferentially textured substrate, preferably glass, a high Mrt orientation ratio (OR) results.

Magnetic thin film media with a bi-layer structure of CrTi/Nip

A magnetic recording disk is provided having an amorphous preseed layer of chromium, titanium, and yttrium. The use of the preseed layer improves the magnetic performance of the disk including signal to noise, inplane orientation, and readback pulsewidth.

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San Jose, CA, United States of America

Qi-Fan Xiao