Micron Technology Incorporated

Pushpa Seetamraju

Mark Ish

Karl David Schuh

Lyle E Adams

Dan Tupy

Kishore Kumar Muchherla

Peter Sean Feeley

Sampath K Ratnam

Jiangang Wu

Gary F Besinga

Cory M Steinmetz

A processing device in a memory system assigns a memory page to a sensitivity tier of a plurality of sensitivity tiers. The processing device determines respective scan intervals for the plurality of sensitivity tiers, wherein the respective scan intervals are based on at least one characteristic of a memory device, the at least one characteristic comprising memory cell margins of the memory device. The processing device scans a subset of a plurality of memory pages, wherein the subset comprises a number of memory pages from each sensitivity tier identified according to the respective scan intervals.

Selective accelerated sampling of failure- sensitive memory pages

A first operation identifier is assigned to a current operation directed to a memory component, the first operation identifier having a first entry in a first data structure that associates the first operation identifier with a first buffer identifier. It is determined whether the current operation collides with a prior operation assigned a second operation identifier, the second operation identifier having a second entry in the first data structure that associates the second operation identifier with a second buffer identifier. A latest flag is updated to indicate that the first entry is a latest operation directed to an address (1) in response to determining that the current operation collides with the prior operation and that the current and prior operations are read operations, or (2) in response to determining to determining that the current operation does not collide with a prior operation.

Handling operation collisions in a non-volatile memory

A processing device in a memory system determines sensitivity value of a memory page in the memory system. The processing device assigns the memory page to a sensitivity tier of a plurality of sensitivity tiers based on a corresponding sensitivity value, wherein each sensitivity tier has a corresponding range of sensitivity values. The processing device further determines a targeted scan interval for each sensitivity tier of the plurality of sensitivity tiers and scans a subset of a plurality of memory pages in the memory component, wherein the subset comprises a number of memory pages from each sensitivity tier determined according to the corresponding targeted scan interval of each sensitivity tier.

Selective accelerated sampling of failure-sensitive memory pages

A first operation identifier is assigned to a first operation directed to a memory component, the first operation identifier having an entry in a first data structure that associates the first operation identifier with a first plurality of buffer identifiers. It is determined whether the first operation collides with a prior operation assigned a second operation identifier, the second operation identifier having an entry in the first data structure that associates the second operation identifier with a second plurality of buffer identifiers. It is determined whether the first operation is a read or a write operation. In response to determining that the first operation collides with the prior operation and that the first operation is a read operation, the first plurality of buffer identifiers are updated with a buffer identifier included in the second plurality of buffer identifiers.

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San Jose, CA, United States of America

Pushpa Seetamraju