Growing community of inventors

Fremont, CA, United States of America

Puneet Yadav

Average Co-Inventor Count = 3.44

ph-index = 7

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 216

Puneet YadavTse-Wei Wang (7 patents)Puneet YadavDavid J Icove (7 patents)Puneet YadavJohn Douglas Birdwell (7 patents)Puneet YadavRoger Horn (7 patents)Puneet YadavAndrew D Bailey, Iii (5 patents)Puneet YadavMikhail Korolik (1 patent)Puneet YadavMichael Ravkin (1 patent)Puneet YadavPratik Misra (1 patent)Puneet YadavPuneet Yadav (12 patents)Tse-Wei WangTse-Wei Wang (30 patents)David J IcoveDavid J Icove (29 patents)John Douglas BirdwellJohn Douglas Birdwell (26 patents)Roger HornRoger Horn (11 patents)Andrew D Bailey, IiiAndrew D Bailey, Iii (134 patents)Mikhail KorolikMikhail Korolik (67 patents)Michael RavkinMichael Ravkin (61 patents)Pratik MisraPratik Misra (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Lam Research Corporation (5 from 3,783 patents)

2. The University of Tennessee Research Foundation (5 from 765 patents)

3. Other (2 from 832,880 patents)


12 patents:

1. 8099733 - Parallel data processing architecture

2. 8060522 - Parallel data processing system

3. 7882106 - Method of indexed storage and retrieval of multidimensional information

4. 7769803 - Parallel data processing architecture

5. 7653515 - Expert knowledge methods and systems for data analysis

6. 7454411 - Parallel data processing architecture

7. 7295954 - Expert knowledge methods and systems for data analysis

8. 7272612 - Method of partitioning data records

9. 7130767 - Computer-implemented data presentation techniques for a plasma processing system

10. 7078344 - Stress free etch processing in combination with a dynamic liquid meniscus

11. 6741983 - Method of indexed storage and retrieval of multidimensional information

12. 6723574 - Method for quantifying uniformity patterns and including expert knowledge for tool development and control

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