Micron Technology Incorporated

Pu Yang

Yuan He

Yantao Ma

An exemplary register circuit includes a plurality of slots to store respective addresses and data pairs. During a write operation, each slot of a plurality of slots preceding a particular slot of the plurality of slots indicated as empty is shifted by one slot to fill the particular slot such that a first end slot of the plurality of slots is made available to receive a new write address and data pair. Each slot of the plurality of slots subsequent to the particular slot retains existing address and data pairs.

Bubble break register in semiconductor device

Techniques for reliable clock speed change and associated circuits and methods are disclosed. Internal voltage supplies of semiconductor devices may include oscillators and charge pump circuits. The oscillator may include at least two clock paths for generating clock signals having different clock frequencies, which can be provided to the charge pump circuit. Further, the oscillator may generate a reset signal configured to activate one clock path over the other (e.g., changing clock speeds). In some embodiments, the oscillator includes a flip-flop to align the reset signal with respect to an edge of an input clock signal supplied to the oscillator such that unintentional (undesired, unexpected) features in the output signal of the oscillator can be avoided when the oscillator changes clock speeds.

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Boise, ID, United States of America

Pu Yang