Mentor Graphics Corporation

Przemyslaw Szczerbicki

Janusz Rajski

Jerzy Tyszer

Nilanjan Mukherjee

Grzegorz Mrugalski

Dariusz Czysz

Disclosed are representative embodiments of methods, apparatus, and systems for power aware test applications involving deterministic clustering of test cubes with conflicts. Embodiments of the disclosed technology can be used to generate low toggling parent patterns to reduce power consumption during testing an integrated circuit. The power consumption may be further reduced by generating low toggling control patterns.

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Wielkopolski, Poland

Przemyslaw Szczerbicki