Western Digital Technologies, Inc.

Sandisk Technologies Inc.

Preeti Yadav

Dana Lee

Prasanna Desai Sudhir Rao

Smita Aggarwal

Nian Niles Yang

Grishma Shah

Deepak Raghu

Philip David Reusswig

Abhijeet Bhalerao

Barys Sarana

Frederick Fernandez

Namita Joshi

A device includes a memory device and a controller. The memory device includes read/write circuitry and a plurality of memory dies. The controller is coupled to the memory device. The controller is configured to, responsive to determining that at least one storage element of a first die of the plurality of memory dies has a characteristic indicative of an aging condition, increase the temperature of the first die by performing memory operations on the first die until detecting a condition related to the temperature.

Memory die temperature adjustment based on aging condition

A device includes a memory device and a controller. The controller is coupled to the memory device. The controller is configured to, in response to receiving a request to perform a memory access at the memory device, determine that the memory device has a characteristic indicative of a temperature crossing. The controller is also configured to, in response to determining that the memory device has the characteristic indicative of the temperature crossing, determine that the memory device satisfies an availability criterion. The controller is further configured to, in response to determining that the memory device satisfies the availability criterion, increase a temperature of the memory device by performing memory operations on the memory device until detecting a condition related to the temperature.

Memory die temperature adjustment based on a power condition

A device includes a memory device and a controller. The controller is coupled to the memory device. The controller is configured to, in response to receiving a request to perform a memory access at the memory device, determine that the memory device has a characteristic indicative of a temperature crossing. The controller is also configured to, in response to the determination, increase a temperature of the memory device by performing memory operations on the memory device until detecting a condition related to the temperature.

A nonvolatile memory die is tested to determine certain parameters such as read time, which are then recorded in the nonvolatile memory die. After the die is incorporated into a memory system, and firmware is downloaded, the nonvolatile memory system uses the recorded parameters to determine how to configure the memory system for operation within specified limits, such as determining how much delay to apply to read operations.

Memory system performance configuration

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Cupertino, CA, United States of America

Preeti Yadav