Qualcomm Incorporated

Applied Micro Circuits Corporation

Prayag Bhanubhai Patel

George Bendak

Martin Saint-Laurent

Animesh Datta

Pratyush Kamal

Kirk Alvin Miller

Ramaprasath Vilangudipitchai

Sushil Kumar Singh

Foua Vang

Kenneth Yun

Esin Terzioglu

Xiaonan Zhang

Ayoob Eusoof Dooply

Eli James Aubrey Fernald

Mohamed Hassan Abu-Rahma

Paul Bassett

John David Huber

Giridhar Nallapati

Philip Michael Clovis

Seid Hadi Rasouli

Pr Chidambaram

Michael Laisne

Michael Hellmer

Chock Hing Gan

Martin L Villafana

Jay Madhukar Shah

Kashyap Ramachandra Bellur

Jim Lew

Peter John Holzer

Xiaoliang Bai

John Calvin Leung

Jianfeng Shi

Chethan Swamynathan

HariKrishna Chintarlapalli Reddy

Peeyush Kumar Parkar

Xiangdong Pan

Sachin Bapat

Varun Verma

Donald D Lyons

Harikrishna Chintarlapalli Reddy

A circuit including a logic gate responsive to a clock signal and to a control signal. The circuit also includes a master stage of a flip-flop. The circuit further includes a slave stage of the flip-flop responsive to the master stage. The circuit further includes an inverter responsive to the logic gate and configured to output a delayed version of the clock signal. An output of the logic gate and the delayed version of the clock signal are provided to the master stage and to the slave stage of the flip-flop. The master stage is responsive to the control signal to control the slave stage.

Flip-flop with reduced retention voltage

A particular method includes receiving a retention signal. In response to receiving the retention signal, the method includes retaining state information in a non-volatile stage of a retention register and reducing power to a volatile stage of the retention register. The non-volatile stage may be powered by an external voltage source. The volatile stage may be powered by an internal voltage source.

Low leakage retention register tray

A circuit includes a pulsed-latch circuit. The pulsed-latch circuit includes a first plurality of transistors. One or more of the first plurality of transistors is length-of-diffusion (LOD) protected.

Length-of-diffusion protected circuit and method of design

A semiconductor standard cell includes an N-type diffusion area and a P-type diffusion area, both extending across the cell and also outside of the cell. The cell also includes a conductive gate above each diffusion area to create a semiconductive device. A pair of dummy gates are also above the N-type diffusion area and the P-type diffusion area creating a pair of dummy devices. The pair of dummy gates are disposed at opposite edges of the cell. The cell further includes a first conductive line configured to couple the dummy devices to power for disabling the dummy devices.

Shared-diffusion standard cell architecture

An apparatus fabricated using a standard cell architecture including devices having different voltage thresholds may include a first set of polylines associated with a first channel length, where each polyline within the first set of polylines is separated by a substantially constant pitch. The apparatus may further include a second set of polylines associated with a second channel length and aligned with the first set of polylines, where each polyline within the second set of polylines is laterally separated by the substantially constant pitch. The apparatus may further include a first active region below the first set of polylines, and a second active region below the second set of polylines, where the first active region and the second active region are separated by a distance of less than 170 nm.

Standard cell architecture using double poly patterning for multi VT devices

Circuit elements are characterized for effects of proximity context on electrical characteristic. Based on the characterization, proximity context cell models, and corresponding modeled electrical characteristic values are obtained. Logic cells are characterized and modeled according to the proximity context cell models. Optionally the electrical characteristic can be time delay, leakage, dynamic power, or coupling noise among other parameters.

Method and apparatus for characterizing and reducing proximity effect on cell electrical characteristics

A semiconductor die includes a group of spacer cells within the semiconductor die. The spacer cells include fiducial markings therein. The fiducial markings can be located within a metal layer, a diffusion layer, a polysilicon layer, and/or a Shallow Trench Isolation (STI) structure.

Techniques providing fiducial markers for failure analysis

Systems and method for defining a timing parameter for a circuit element based on process variation, including, determining a point of failure parameter associated with the timing parameter, the point of failure parameter correlated with a specific value of the process variation. A standard deviation associated with the point of failure parameter is determined. The process variation per the standard deviation is calculated and the timing parameter for the circuit element is defined as a function of the failure parameter, the standard deviation, and the process variation per the standard deviation. A margin factor, which varies with the standard deviation, is optionally applied to the timing parameter. The timing parameter may be one of a setup time or hold time.

Yield based flop hold time and setup time definition

A clock gating cell that comprises a latch in communication with an input enable logic and an output logic circuit, wherein the latch includes a pull-up and/or a pull-down circuit at an input node of the output logic circuit and circuitry preventing premature charge or discharge of the output logic circuit input node by the pull-up and/or the pull-down circuit when the clock gating cell is enabled.

Systems and methods using improved clock gating cells

A logic device includes a data input, a scan test input, a clock demultiplexer, and a master latch. The clock demultiplexer is responsive to a clock input to selectively provide a first clock output and a second clock output. The master latch is coupled to the data input and to the scan test input and includes an output. The master latch is responsive to the first clock output of the clock demultiplexer and the second clock output of the clock demultiplexer to selectively couple the data input or the scan test input to the output.

Logic device and method supporting scan test

A system and method are provided for tolerating data line faults in a packet communications switch fabric. The method comprises: accepting information packets including a plurality of cells, at a plurality of ingress port card ports, the plurality of information packets addressing a plurality of egress port card ports; selectively connecting port card ports to port card backplane data links; selectively connecting port card backplane data links and crossbars; sensing a connection fault in a backplane data link; in response to sensing the fault, reselecting connections between the port card ports and the port card backplane data links; in response to reselecting connections between the port card ports and the port card backplane data links, serially transferring packets through the port cards; serially transferring packets through the crossbars to the egress port cards; and, suspending use of the faulty connection.

System and method for tolerating data link faults in a packet communications switch fabric

A system and method are provided for configuring interface bandwidths in a packet communications switch fabric. The method comprises: interfacing data links with a first plurality of traffic managers (TMs); differentiating port card interface ports into a first plurality of subchannels associated with the first plurality of TMs; and, communicating packets information with the TMs at a first plurality of data rates corresponding to the first plurality of subchannels. More specifically, differentiating port card interface ports into a first plurality of subchannels associated with the first plurality of TMs includes: differentiating a second plurality of ingress data links into a third plurality of ingress subchannels associated with a third plurality of ingress traffic managers (iTMs); and, differentiating a fourth plurality of egress data links into a fifth plurality of egress subchannels associated with a fifth plurality of egress TMs (eTMs).

Configurable switch fabric interface bandwidth system and method

A system and method are provided for controlling packet header information in a packet communications switch fabric. The method comprises: programming the cell header overhead (OH) field definitions; accepting a packet including a plurality of cells and corresponding cell headers, each cell header including a plurality of overhead fields; defining the cell header OH fields; and, transmitting the packet. Defining the cell header OH fields includes defining cell header OH field location, position, meaning, structure, and length. In other aspects, the method comprises redefining the cell header overhead fields, once they are accepted. For example, the OH field information can be modified, relocated, or an OH field can be added to the cell header. In yet other aspects, the OH field information can be extracted and/or reformatted.

System and method for programming cell packet headers

A system and method are provided for tolerating data line faults in a packet communications network. The method comprises: serially transmitting information packets from at least one traffic manager (TM); at a switch fabric, accepting information packets at a plurality of ingress ports, the information packets addressing destination port card egress ports; selectively connecting port card ingress ports to port card egress ports; serially supplying information packets from a plurality of port card egress ports; sensing a connection fault between the switch fabric and the TM; and, in response to sensing the fault, reselecting connections between the switch fabric port card ports and the TM. Some aspects comprise: an ingress memory subsystem (iMS) receiving cells on an ingress port exceeding an error threshold. Then, reselecting connections between the port card ports and the TM includes the iMS sending a message to the iTM identifying the faulty ingress connection.

System and method for tolerating data link faults in communications with a switch fabric

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San Diego, CA, United States of America

Prayag Bhanubhai Patel