Texas Instruments Corporation

Prashanth Saraf

Prakash Narayanan

Indu Prathapan

Sundarrajan Rangachari

Saket Jalan

Desmond Pravin Martin Fernandes

A circuit includes a test circuit in an integrated circuit to test signal timing of a logic circuit under test in the integrated circuit. The signal timing includes timing measurements to determine if an output of the logic circuit under test changes state in response to a clock signal. The test circuit includes a bit register that specifies which bits of the logic circuit under test are to be tested in response to the clock signal. A configuration register specifies a selected clock source setting from multiple clock source settings corresponding to a signal speed. The selected clock source is employed to perform the timing measurements of the specified bits of the bit register.

Transition fault testing of functionally asynchronous paths in an integrated circuit

Transistion fault testing of funtionally asynchronous paths in an integrated circuit

In the described examples, a memory controller includes a read-modify-write logic module that receives a partial write data request for partial write data in error-correcting code (ECC) memory and combines the partial write data in the partial write data request with read data provided from the ECC memory to form combined data prior to correcting the read data. The memory controller also includes a write control module that controls the writing of the combined data to the ECC memory.

Error-correcting code memory

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Prashanth Saraf