Texas Instruments Corporation

Prasanth Viswanathan Pillai

Alexander Tessarolo

Venkatesh Natarajan

Shailesh Ganapat Ghotgalkar

Rajeev Suvarna

Richard Mark Poley

Saya Goud Langadi

Jeffrey Earl Stafford

Ashish Arvind Vanjari

Rajasekhar Reddy Allu

Amritpal Singh Mundra

Srinivasa Chakravarthy

David Peter Foley

Swathi Gangasani

Vaskar Sarkar

Maheedhar Janaki Jalasutram

Mohammed Arif

Bhargov Bora

Saravanan G

Methods, apparatus, systems, and articles of manufacture are described corresponding to immutable configuration of memory devices. An example memory includes a memory bank including a first portion and a second portion, the second portion configured to store configuration information that specifies whether the first portion is immutable; and a controller coupled to the memory bank, the controller configured to determine whether to prevent data from being written to the first portion based on the configuration information.

Methods and apparatus to facilitate immutable configuration of memory devices

An example device comprising: first clock divider circuitry to be coupled to a first clock; first counter circuitry configured to be coupled to the first clock divider circuitry, the first counter circuitry configured to increment based on the first clock and a second clock; second clock divider circuitry to be coupled to a third clock; second counter circuitry configured to be coupled to the second clock divider circuitry, the second counter circuitry configured to increment based on the third clock and the second clock; and comparison circuitry coupled to the first and second counter circuitry.

Method and apparatus for early detection of signal excursion out of frequency range

An example apparatus includes a buffer configured to, when enabled: obtain an input voltage; and provide the input voltage to a first boundary cell; and a second boundary cell configured to, when the apparatus is used in analog mode and a boundary scan occurs disable the buffer.

Methods and apparatus to implement a boundary scan for shared analog and digital pins

An example apparatus includes multiplexer circuitry configured to couple a communication module to at least one of a data bus input or a test signal; and embedded pattern generator (EPG) circuitry coupled to the multiplexer circuitry, the EPG circuitry including: clock divider circuitry including a plurality of clock outputs, the clock divider circuitry configured to be coupled to an output of a clock, the plurality of clock outputs configured to be of a frequency equal to a division of a frequency of the output of the clock; a multiplexer including a multiplexer output, the multiplexer configured to couple one of the plurality of clock outputs to the multiplexer output; and signal generator circuitry including an input clock, an EPG input, and a plurality of data outputs, the input clock coupled to the multiplexer output, the signal generator circuitry configured to generate a data stream.

Embedded pattern generator

Lockstep comparators and related methods are described. An example apparatus includes self-test logic circuitry having first outputs, and comparator logic including selection logic having first inputs and second outputs, ones of the first inputs coupled to the first outputs, first detection logic having second inputs and third outputs, the second inputs coupled to the second outputs, second detection logic having third inputs and fourth outputs, the third inputs coupled to the third outputs, latch logic having fifth inputs and fifth outputs, the third output and the fourth output coupled to the fifth inputs, and error detection logic having sixth inputs coupled to the fifth inputs.

Lockstep comparators and related methods

In described examples, an apparatus is arranged to generate a linear term, a quadratic term, and a constant term of a transcendental function with, respectively, a first circuit, a second circuit, and a third circuit in response to least significant bits of an input operand and in response to, respectively, a first, a second, and a third table value that is retrieved in response to, respectively, a first, a second, and a third index generated in response to most significant bits of the input operand. The third circuit is further arranged to generate a mantissa of an output operand in response to a sum of the linear term, the quadratic term, and the constant term.

Transcendental function evaluation

In described examples, a counter system includes a counter, a parity detector, a toggle flop, and a comparator. The counter iterates a count through a set of binary states in response to a clock signal, so that a binary value of a single bit of the count changes at each iteration. The parity detector detects the parity of the count. The toggle flop output is coupled to the toggle flop input. The toggle flop outputs a binary flop value. The binary flop value toggles between zero and one in response to the toggle flop input and the clock signal. The comparator compares the parity of the count and the toggle flop output, and outputs a first comparator value if the parity of the count and the toggle flop output are the same, and a second comparator value if the parity of the count and the toggle flop output are different.

Self-diagnostic counter

An integrated circuit (IC) chip for providing a safety-critical value includes first and second processing paths. The first processing path includes a first processing element and is coupled to receive a first input signal on a first input pin and to provide a first output signal that provides the safety-critical value on an output pin. The second processing path includes a second processing element and is coupled to receive a second input signal and to provide a second output signal. The first processing path and the second processing path are independent of each other. A smart comparator on the IC chip receives the first output signal and the second output signal and initiates a remedial action responsive to a difference between the first output signal and the second output signal reaching a configurable threshold.

Apparatus having signal chain lock step for high integrity functional safety applications

A processor (and method) includes a core that performs a floating point division through execution of various instructions. The instructions include a sign, exponent, and mantissa (SEM) separation instruction which causes the core to extract the sign, exponent and mantissa values from numerator and denominator floating point numbers. The instructions also include an unsigned mantissa division instruction which cause the core to iteratively perform a conditional subtraction operation to compute a value indicative of a mantissa of the quotient. The instructions further include a merge instruction that causes the core to generate a quotient floating point number using the extracted sign and exponent from the SEM separation instruction and the value indicative of the mantissa of the quotient.

Architecture and instruction set to support interruptible floating point division

A processor includes a core and a plurality of registers including a first register, a second register, and a third register. The core is configured to perform a division operation that includes execution of a sign extraction instruction in which a sign of at least one of a numerator value and a denominator value is stored, a conditional subtraction instruction which divides the numerator value by the denominator value to generate a quotient value and a remainder value, and a sign assignment instruction which adjusts the sign of at least one of the quotient and remainder values. The conditional subtraction instruction is configured to cause the core to perform multiple iterations of a conditional subtraction in one execution of the conditional subtraction instruction and in one clock cycle. Others methods and apparatus are described as well.

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Bengaluru, India

Prasanth Viswanathan Pillai