Qualcomm Incorporated

Prasanna Madhusudhanan

Enoch Shiao-Kuang Lu

Tae Min Kim

Yuanning Yu

Pranay Sudeep Rungta

Paolo Minero

Marvin Leroy Vis

Yusuf Said Eroglu

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may select a maximum supported rank for reception that is capped based at least in part on one or more impacted antennas of the UE that are unavailable due to sounding reference signal (SRS) switching that switched at least one antenna of the UE. The UE may transmit an indication of the maximum supported rank. The UE may receive a selected rank that is no greater than the maximum supported rank. The UE may receive, from one or more non-impacted antennas of the UE, a communication using the selected rank. Numerous other aspects are described, such as downlink blanking, desensing parameters, canceling SRS switching, and uplink blanking for impacted antennas.

Sounding reference signal switching impact mitigation

Certain aspects of the present disclosure relate to methods and apparatus for testing millimeter wave devices. The method includes determining a reference antenna response of the DUT for at least one antenna of a test chamber, generating one or more fading coefficients for the at least one antenna based on the determined reference antenna response, applying the generated one or more fading coefficients to at least one signal, and transmitting the at least one signal via the at least one antenna to the DUT in the test chamber.

Methods and apparatus for testing millimeter wave devices

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Boulder, CO, United States of America

Prasanna Madhusudhanan