Xilinx, Inc.

Micron Technology Incorporated

Pranjal Chauhan

Alex Scott Warshofsky

Banadappa V Shivaray

Ahmad R Ansari

Leonid Minz

Leon Zlotnik

Tomai Knopp

Ismed D Hartanto

Pramod Surathkal

Soumitra Kumar Bhowmick

Clock enable signals are collected and summed. The number of simultaneously enabled clock enable signals can represent switching activity within a system and can be used as an indicator for power management, noise management, etc. of such a system. Digital switching activity sensing include performance of an operation to sum a quantity of open clock gates associated with a plurality of latches that are grouped into multiple subsets of latches. An activity indication is generated based, at least in part, on a result of the operation to sum the quantity of open clock gates associated with the plurality of latches.

Digital switching activity sensing

A disclosed integrated circuit includes first and second clock generation circuits, a stagger circuit, and a plurality of scan chains. The first clock generation circuit receives a first clock signal and generates a first set of clock pulses having a first frequency in response to receipt of a first clock trigger signal and a first enable signal. The second clock generation circuit receives a second clock signal and generates a second set of clock pulses having a second frequency in response to receipt of a second clock trigger signal and a second enable signal. The stagger circuit generates the first and second clock trigger signals from the global trigger signal at different times. The first set of clock pulses are staggered relative to the second set of clock pulses. The plurality of scan chains test functionality of logic circuitry within the IC chip using the first and second set of clock pulses.

Clock generation for integrated circuit testing

Embodiments herein describe a methodology for performing non-destructive LBIST when booting an integrated circuit (IC). In one embodiment, when powered on, the IC begins the boot process (e.g., a POST) which is then paused to perform LBIST. However, instead of corrupting or destroying the boot mode state of the IC, the LBIST is non-destructive. That is, after LBIST is performed, the booting process can be resumed in the same state as when LBIST began.

Non-destructive online testing for safety critical applications

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Fatehpur, India

Pranjal Chauhan