Qualcomm Incorporated

Pranjal Bhuyan

Rahul Gulati

Robert Hardacker

Nhon Toai Quach

Mainak Biswas

Palkesh Jain

Roberto Averbuj

Jeffrey Shabel

Mohammad Reza Kakoee

John Chi Kit Wong

Arvind Jain

Nishi Bhushan Singh

Dafna Shaool

Hemang Jayant Shah

Sanjay Gupta

Rakesh Kumar Kinger

David Barr

Mattheus Heddes

Virendra Bansal

A computing device includes a hardware resource, a component to send a transaction signal including a target address of the hardware resource, a security data associated with an initiator of the transaction signal, and a safety data associated with the initiator, and an access control unit coupled to the component and the hardware resource, the access control unit to receive the transaction signal, determine whether security access is granted based on the transaction signal, determine whether safety access is granted based on the transaction signal, and allow access to the hardware resource based on both the security access and the safety access being granted.

Computing device to provide access control to a hardware resource

A self-test controller includes a memory configured to store a test patterns, configuration registers, and a memory data component. The test patterns are encoded in the memory using various techniques in order to save storage space. By using the configuration parameters, the memory data component is configured to decode the test patterns and perform multiple built-in self-test on a multitude of test cores. The described techniques allow for built-in self-test to be performed dynamically while utilizing less space in the memory.

In-field self-test controller for safety critical automotive use cases

Various additional and alternative aspects are described herein. In some aspects, the present disclosure provides a method of testing error-correcting code (ECC) logic. The method includes receiving data for storage in a memory. The method further includes receiving an address indicating a location in the memory to store the data. The method further includes determining if the received address matches at least one of one or more test addresses. The method further includes operating the ECC logic in a normal mode when the received address does not match at least one of the one or more test addresses. The method further includes operating the ECC logic in a test mode when the received address does match at least one of the one or more test addresses.

Error correcting code testing

Systems and methods are disclosed for error correction control (ECC) for a memory device comprising a data portion and an ECC portion, the memory device coupled to a system on a chip (SoC). The SoC includes an ECC cache. On receipt of a request to write a line of data to the memory, a determination is made if the data is compressible. If so, the data line is compressed. ECC bits are generated for the compressed or uncompressed data line. A determination is made if an ECC cache line is associated with the received data line. If the data line is compressible, the ECC bits are appended to the compressed data line and the appended data line is stored in the data portion of the memory. Otherwise, the ECC bits are stored in the ECC cache and the data line is stored in the data portion of the memory.

Systems and methods for implementing error correcting code in a memory

A display processor of a display system may receive an image that includes a test pattern. An input checksum may be associated with the test pattern. Hardware units of the display processor may process the image. The display system may generate an output checksum based at least in part on the test pattern after processing of the image. The display system may detect a fault in the hardware units of the display processor based on determining a difference between the input checksum and the output checksum.

Testing of display subsystems

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San Diego, CA, United States of America

Pranjal Bhuyan