Texas Instruments Corporation

Pranav Murthy

Rahul Gulati

Virendra Bansal

Ashutosh Tiwari

Srinivas Kumar Vooka

Ish Kumar Dham

Vishwanath S

Ratheesh Thekke Veetil

On-chip field testing methods and apparatus are disclosed. Example on-chip testers disclosed herein include a decoder having a test data input and a test stimuli interface. Disclosed example on-chip testers also include a multiplexer having a first multiplexer interface coupled to the test stimuli interface, a second multiplexer interface coupled to an automatic test equipment interface, a third multiplexer interface coupled to a design-for-testing subsystem interface and an interface selection input. Disclosed example on-chip testers further include a memory having a memory interface coupled to the test data input.

On-chip field testing methods and apparatus

An integrated circuit (IC) includes a plurality of input/output (I/O) terminals through which signals pass into or out of the IC and an I/O timing module. The I/O timing module is configured to add propagation delay to signals passing between the I/O terminals and I/O subsystems of the IC. The I/O timing module includes a plurality of delay elements associated with each of the I/O terminals, a control register associated with each of the I/O terminals, a memory, and I/O delay control logic. The control register is coupled to each of the delay elements associated with the I/O terminal. The memory is encoded with delay information. The I/O delay control logic is configured to initialize the propagation delay associated with each of the I/O terminals by selecting which of the delay elements are to be applied to produce the propagation delay based on the delay information stored in the memory.

System and method for controlling circuit input-output timing

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Bengaluru, India

Pranav Murthy