International Business Machines Corporation

Other

Infineon Technologies Ag

Infineon Technologies North America Corp.

Prakash Chimanlal Dev

Daniel C Edelstein

David M Dobuzinsky

Gill Yong Lee

Richard Anthony Conti

Alexander William Simpson

Kia-Seng Low

Peter Wrschka

Padraic C Shafer

Ramachandra Divakaruni

Timothy Joseph Dalton

Johnathan E Faltermeier

Larry Alan Nesbit

Scott David Halle

William J Cote

Arpan Pravin Mahorowala

Rajesh Rengarajan

Chienfan Yu

Rajeev Malik

Michael Maldei

Munir-ud-Din Naeem

John Preston Benedict

Thomas Rupp

Arnd Scholz

An etch rate of a nitride liner layer is improved relative to an etch rate of a nitride cap layer. The nitride liner layer is located at an exposed portion of a substrate adjacent to a stacked structure also located atop the substrate. The nitride cap layer is located atop the stacked structure. An oxide spacer is formed along sidewalls of the stacked structure. The nitride liner layer is patterned and etched to form at least one opening therein to the substrate while the nitride cap layer remains substantially intact.

Method of reducing erosion of a nitride gate cap layer during reactive ion etch of nitride liner layer for bit line contact of DRAM device

A structure and method for an insulator layer having carbon-graded layers above a substrate is disclosed, wherein the concentration of carbon increases in each successive carbon-graded layer above the substrate. The insulator comprises a low-k dielectric having a dielectric constant less than 3.3. The carbon-graded layer increases adhesion between the substrate and the insulator and between the insulator and the conductor layer. The structure may also include stabilization interfaces between the carbon-graded layers. More specifically, the carbon-graded layers include a first layer adjacent the substrate having a carbon content between about 5% and 20%, a second layer above the first layer having a carbon content between about 10% and 30%, and a third layer above the second layer having a carbon content between about 20% and 40%.

Carbon-graded layer for improved adhesion of low-k dielectrics to silicon substrates

A process for forming a damascene structure includes depositing a bilayer comprising a first dielectric layer and a second dielectric layer onto a substrate, wherein the first layer has a dielectric constant higher than the second layer, and wherein the second layer is selected from a low k dielectric material comprising Si, C, O and H. The multi-step damascene structure is patterned into the dielectric bilayer using highly selective anisotropic reactive ion etching. Photoresist, polymers and post etch residues are removed from the substrate using a plasma ashing process without damaging the underlying dielectric layers.

Process for forming a damascene structure

A method is provided for forming an inside nitride spacer in a deep trench device DRAM cell. The method includes depositing an oxide liner in a trench etched from a semiconductor material, wherein the oxide lines abuts a pad nitride layer, a pad oxide layer under the pad nitride layer, and a recessed gate poly in the trench. The method further includes depositing a spacer material on the oxide liner, removing exposed portions of the oxide layer from the semiconductor, and depositing a poly stud material over the semiconductor wherein the spacer material is encapsulated in poly stud material. The method includes polishing the semiconductor to the top trench oxide layer, and etching the top trench oxide layer.

Method for forming inside nitride spacer for deep trench device DRAM cell

The vertical MOSFET structure used in forming dynamic random access memory comprises a gate stack structure comprising one or more silicon nitride spacers; a vertical gate polysilicon region disposed in an array trench, wherein the vertical gate polysilicon region comprises one or more silicon nitride spacers; a bitline diffusion region; a shallow trench isolation region bordering the array trench; and wherein the gate stack structure is disposed on the vertical gate polysilicon region such that the silicon nitride spacers of the gate stack structure and vertical gate polysilicon region form a borderless contact with both the bitline diffusion region and shallow trench isolation region. The vertical gate polysilicon is isolated from both the bitline diffusion and shallow trench isolation region by the nitride spacer, which provides reduced bitline capacitance and reduced incidence of bitline diffusion to vertical gate shorts.

Modified vertical MOSFET and methods of formation thereof

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Plano, TX, United States of America

Prakash Chimanlal Dev