Altera Corporation

Oracle International Corporation

Pradeep Nagarajan

Yan Chong

Joseph Huang

Chiakang Sung

Sean Shau-Tu Lu

Bonnie I Wang

Khai Nguyen

Xiaobao Wang

Weiqi Ding

Dawei Huang

Chaitanya Palusa

Warren Nordyke

Jiangyuan Li

Chiakang Song

James Kimble Lin

Embodiments enable built-in sinusoidal jitter injection, for example, in a serializer/deserializer (SERDES) circuit. For example, embodiments can receive a tracking profile that corresponds to a predetermined sinusoidal jitter (SJ) profile and a predetermined phase interpolator (PI) profile. A shift determination can be made for each of a plurality of insertion times according to the tracking profile, the shift determination indicating whether to adjust phase interpolation of the SERDES circuit. At each of the plurality of insertion times, a phase adjustment signal can be generated as a function of the shift determination. For example, the phase adjustment signal can indicate a control code for a phase interpolator coupled to a clock generator of the SERDES, and the signal can be output to the phase interpolator. Some implementations adjust the phase interpolator in response to the phase adjustment signal, such that the phase interpolator injects SJ that substantially tracks the SJ profile.

SERDES built-in sinusoidal jitter injection

A buffer circuit with an adjustable reference voltage is presented. The buffer circuit with adjustable reference voltage has an input buffer circuit that is connected to a data input and a reference voltage. The output of the input buffer circuit is connected an eye monitor circuit that generates a transition signal based on a number of transitions of an output of the input buffer circuit. The output from the eye monitor circuit is that processed by a calibration control circuit that transmits a selection signal to a multiplexer. The multiplexer selects a level of the reference voltage based on the selection signal from the calibration control circuit.

On-die input reference voltage with self-calibrating duty cycle correction

Systems and methods are disclosed for calibrating a Data Strobe (DQS) enable/disable signal and for tracking the timing of the DQS enable/disable signal with respect to changes in voltage and temperature (VT) in order to improve the timing margin of the DQS enable/disable signal in programmable devices using Double Data Rate (DDR) memory. In an exemplary embodiment, the system includes a gating circuit, a sampling circuit, and a delay chain tracking circuit. The gating circuit receives a DQS enable signal and a input DQS signal, calibrates the DQS enable signal based on an amount of delay, and outputs the calibrated DQS signal. The sampling circuit provides the amount of delay to the gating circuit based on a sampling clock. The delay chain tracking circuit maintains the timing of the calibrated DQS enable signal over a plurality of clock cycles based on the sampling clock and a leveling clock.

Circuit design technique for DQS enable/disable calibration

A circuit-includes a delay locked loop (DLL), a calibration circuit and an output delay chain controlled by the calibration circuit. The DLL comprises a plurality of series-coupled first delay elements, each of which has substantially the same first delay. The calibration circuit comprises a plurality of series-coupled second delay elements, each of which has substantially the same second delay that is less than the first delay, a first delay element, and a circuit for determining the minimum number of second delay elements that are needed to produce the first delay. The output delay chain comprises a plurality of series-coupled second delay elements, an input for receiving the input signal, and a circuit for selectively tapping the output delay chain at a plurality of taps in the output delay chain so as to produce in the input signal different delays of integral multiples of the second delay.

Digital PVT compensation for delay chain

A circuit includes first and second bidirectional clock networks and first and second clock signal generation circuits. A first multiplexer circuit is configurable to provide a first clock signal from a first pin to the first bidirectional clock network. A second multiplexer circuit is configurable to provide the first clock signal from the first bidirectional clock network to the second bidirectional clock network. Third multiplexer circuits are configurable to provide the first clock signal from the second bidirectional clock network to the first and the second clock signal generation circuits.

Circuits and methods for providing clock signals

A circuit includes a delay locked loop (DLL), a calibration circuit and an output delay chain controlled by the calibration circuit. The DLL comprises a plurality of series-coupled first delay elements each of which has substantially the same first delay. The calibration circuit comprises a plurality of series-coupled second delay elements, each of which has substantially the same second delay that is less than the first delay, a first delay element, and a circuit for determining the minimum number of second delay elements that are needed to produce the first delay. The output delay chain comprises a plurality of series-coupled second delay elements, an input for receiving the input signal, and a circuit for selectively tapping the output delay chain at a plurality of taps in the output delay chain so as to produce in the input signal different delays of integral multiples of the second delay.

Circuits and a method for correcting duty cycle distortions in an integrated circuit (IC) are disclosed. The IC includes a splitter circuit that is coupled to receive a clock signal. The clock signal is split into two different clock signals. One of the clock signals is an inverted version of the other. A delay circuit is coupled to each of the clock signals. Each of the delay circuits generates a delayed version of the corresponding clock signal. A corrector circuit is coupled to receive both the delayed versions of the clock signals. The corrector circuit generates a clock output signal with a corrected duty cycle.

Duty cycle correction circuit for memory interfaces in integrated circuits

Integrated circuits may include memory interface circuitry operable to communicate with system memory. The memory interface circuitry may receive data and data strobe signals from system memory during read operations. The memory interface circuitry may include de-skew circuitry and dynamic variation compensation circuitry. The de-skew circuitry may be configured during calibration procedures to reduce skew between the data and data strobe signals. The dynamic variation compensation circuitry may be used in real time to compensate for variations in operating conditions. The dynamic variation compensation circuitry may include a phase generation circuit operable to generate data strobe signals having different phases, an edge detection circuit operable to detect leading/trailing edge failures, a control circuit operable to control a counter, and an adjustable delay circuit that is controlled by the counter and that is operable to properly position the data signal with respect to its corresponding data strobe signal.

Variation compensation circuitry for memory interface

A circuit includes a locked loop and a phase offset circuit. The locked loop generates first control signals for controlling a first delay in the locked loop. The phase offset circuit delays an input signal by a second delay that is controlled by second control signals to generate a delayed signal. The phase offset circuit generates the second control signals by adjusting the first control signals to increase the accuracy of the delayed signal with respect to a target phase. The second control signals compensate for at least a portion of a change in the second delay that is caused by a variation in at least one of a process, a supply voltage, and a temperature of the circuit.

Techniques for generating PVT compensated phase offset to improve accuracy of a locked loop

A feedback loop circuit includes a phase detector and delay circuits. The phase detector generates an output signal based on a delayed periodic signal. The delay circuits are coupled in a delay chain that delays the delayed periodic signal. Each of the delay circuits includes variable delay blocks and fixed delay blocks that are coupled to form at least two delay paths for an input signal through the delay circuit to generate a delayed output signal. Delays of the variable delay blocks in the delay circuits vary based on the output signal of the phase detector. Each of the delay circuits reroutes the input signal through a different one of the delay paths to generate the delayed output signal based on the output signal of the phase detector during operation of the feedback loop circuit.

Techniques for providing multiple delay paths in a delay circuit

A feedback loop circuit includes a phase detector and delay circuits. The phase detector generates an output signal based on a delayed periodic signal. The delay circuits are coupled in a delay chain that delays the delayed periodic signal. Each of the delay circuits comprises variable delay blocks and fixed delay blocks that are coupled to form at least two delay paths for an input signal through the delay circuit to generate a delayed output signal. Delays of the variable delay blocks in the delay circuits vary based on the output signal of the phase detector. Each of the delay circuits reroutes the input signal through a different one of the delay paths to generate the delayed output signal based on the output signal of the phase detector during operation of the feedback loop circuit. Each of the variable delay blocks and the fixed delay blocks is inverting.

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Santa Clara, CA, United States of America

Pradeep Nagarajan