Sun Microsystems, Inc.

Lsi Logic Corporation

Oracle America, Inc.

Sun Microsysytems, Inc.

Prabhansu Chakrabarti

Jyh-Ming Jong

Leo Yuan

Brian L Smith

Wai Fong

Chung-Hsiao Wu

Jue Wu

Drew George Doblar

Michael C Freda

Sadanand R Patil

Lawrence David Smith

Michael J Bushue

Tai-Yu Chou

William H Schwartz

Margaret H Wang

A voltage regulator. The voltage regulator includes an interposer having, on a first side, a plurality of electrical connections suitable for coupling to a printed circuit board (PCB). The interposer also includes at least one power plane and at least one ground plane, wherein each of the power and ground planes is coupled to one or more of the electrical connections. The voltage regulator further includes a DC-DC converter that is electro-mechanically attachable to and detachable from the interposer. The interposer includes a socket, on a second side, that is suitable to receive two or more electro-mechanical connecting members of the DC-DC converter. When the DC-DC converter is attached to the interposer, at least one of the electromechanical connecting members is electrically coupled to a power plane of the interposer, while at least one other one of the electromechanical connecting members is electrically coupled to the ground plane.

Voltage regulator attach for high current chip applications

A method of tuning a test trace that is capacitively coupled to a number of signal traces. A method for determining a configuration of a device comprising signal traces and a capacitively coupled test trace may include selecting a test frequency of a test signal to be driven on selected signal traces during a test mode of device operation, and tuning circuit characteristics of the test trace to generate a bandpass frequency response including a passband and a stopband, where a detection frequency corresponding either to the test frequency or a selected harmonic of the test frequency is included in the passband. Tuning of circuit characteristics may include selecting a degree of capacitive coupling between the test trace and the signal traces such that, within a specified constraint for signal degradation on the signal traces, the bandpass frequency response of the given test trace satisfies a specified transmission requirement at the detection frequency.

Tuning a test trace configured for capacitive coupling to signal traces

A method and apparatus for automated calibration of I/O over a multi-variable eye window is provided. A transmitter may conduct data transmissions to a receiver of an integrated circuit (IC) over a plurality of signal lines. The data transmissions may be conducted according to a certain parameters or sets of parameters. Parameters may include voltage levels at which signals are transmitted or timing delays. The receiver may determine whether the correct data value was received over each signal line. The results may be recorded in a storage mechanism in the same IC as the receiver. The storage mechanism may, for each signal line, store a pass/fail result corresponding to the particular parameters for the data transmission. The system may select the parameters which subsequent transmissions are to be conducted over each of the plurality of signal lines from the storage mechanism.

Automated calibration of I/O over a multi-variable eye window

A remote voltage regulator module (VRM) for high-current, low voltage applications. In one embodiment, an electronic system includes a VRM configured to provide a DC output voltage. The VRM is coupled to a load board via a first bus bar and a second bus bar. The VRM includes a first capacitance of a first amount, while the load board includes a second capacitance of a second amount. A loop between the VRM and the load board is formed by the first and second bus bars and first and second capacitances. The loop is characterized by a transfer function that is second order or less.

Remote DC-DC converter for high current, low voltage applications

A system may perform interconnect BIST (IBIST) testing on source synchronous links. The system may perform, at normal operating frequency, a source synchronous link test that tests a victim line on the source synchronous link using a transition weave pattern. The transition weave pattern causes interaction between a data transition on the victim line, previous transitions on the victim line, and transitions on the other lines of the link (the 'aggressor' lines). The interaction caused may be: (i) a first crossing pulse on the victim line; (ii) a second crossing pulse of the opposite polarity on each aggressor line concurrent with the first crossing pulse on the victim line; and (iii) a reflection in the opposite direction of the first transition of the first crossing pulse, wherein the reflection results from a previous transition on the victim line.

Source synchronous link integrity validation

A method and apparatus for operating a source synchronous receiver. In one embodiment, a source synchronous receiver may include a clock receiver comprising a clock detector and a clock signal buffer. The clock detector may be configured to detect a first clock signal and assert a clock detect signal responsive to detecting the first clock signal. The clock buffer may receive the first clock signal and produce a second clock signal, which may be driven to a digital locked loop (DLL) circuit, where the second clock signal is regenerated and driven to a data buffer of the source synchronous receiver. The clock detect signal may be received by a clock verification circuit. The clock verification circuit may be configured to initiate a reset of the source synchronous receiver upon a failure to receive the clock detect signal. The resetting of the source synchronous receiver may be performed locally, and does not reset the core logic of the device in which it is implemented, nor any other source synchronous port on the device. Thus, other source synchronous ports on the device, as well as the core logic, may be able to continue operations as normal. The method and apparatus may include a source synchronous receiver that is hot-swappable.

Source synchronous receiver link initialization and input floating control by clock detection and DLL lock detection

One embodiment of the present invention provides a system for detecting a valid clock signal at a clock receiver. The system operates by receiving a clock signal at the clock receiver, and directing the clock signal into a control input of a voltage-controlled variable resistor. Next, the system uses the voltage-controlled variable resistor to control a first current. A current mirror is then employed to create a second current from the first current. This second current passes through a resistor to produce a control voltage, which is amplified to produce a validity signal indicating whether or not the clock signal is valid. In one embodiment of the present invention, the system additionally uses at least one capacitor to filter out periodic fluctuations in the validity signal.

Method and apparatus for detecting valid clock signals at a clock receiver circuit

An on-chip DC voltage generator providing a marginable reference voltage signal is described. The present invention is a CMOS-based integrated circuit that generates a marginable reference voltage level. The present invention provides a process insensitive reference voltage signal and may be configured so as to generate a ground-bounce-noise free signal.

Apparatus for on-chip reference voltage generator for receivers in high speed single-ended data link

A method for assigning power and ground pins in array packages in order to enhance next level routing is provided. In one embodiment, the method comprises arranging connections of a semiconductor array package, the semiconductor package having an integrated circuit with power, ground, and signal connections, in 2&times;3 connection grids. Each connection grid includes a power connection and a ground connection which is adjacent to the power connection. The 2&times;3 connection grids are arranged so that each connection at the periphery is a signal connection. A 4:1:1 signal:power:ground connection ratio is maintained in the arrangement, wherein no more than four signal connections are present for each power connection, and no more than four signal connections are present for each ground connection.

Method for assigning power and ground pins in array packages to enhance next level routing

A method and circuitry for pre-emphasizing transmitted logic signals. The method and circuitry may be applied to single-ended center-taped terminated I/O lines. In one embodiment, a driver circuit may be configured for monitoring the logic values (i.e. logic 0, logic 1, or logic low, logic high) of signals transmitted by the driver circuit. The driver circuit may compare the logic value of a next logic signal to be transmitted with a first previously transmitted signal and a second previously transmitted signal. Pre-emphasis of the next logic signal may occur based on the logic value of the next logic signal to be transmitted as well as the logic values of the first and second logic signals. If the first and second logic signals have the same logic value, and the next logic signal has a different value, the next logic value may be pre-emphasized. If the next logic signal has a logic value that is equivalent to either the first logic signal or the second logic signal, it may be transmitted without pre-emphasis.

Method and circuitry for a pre-emphasis scheme for single-ended center taped terminated high speed digital signaling

A semiconductor device package for one or more semiconductor dice uses a package substrate having one pair of biplanar conductive planes and another pair of biplanar conductive planes. The pairs of planes are positioned in a coplanar relationship between the top traces and the bottom traces. Power may be supplied to die core circuits through one pair of planes and to die input-output circuits through another pair of planes to decouple the core circuits from the input-output circuits and minimize noise induced false switching in either set of circuits. The core circuits and the input-output circuits may be powered by the same power supply or separate power supplies.

Growing community of inventors

Sunnyvale, CA, United States of America

Prabhansu Chakrabarti