Vanguard International Semiconductor Corporation

Po-Sheng Hu

Ching-Yi Hsu

Pi-Kuang Chuang

Shih-Ming Chen

Hsiao-Ying Yang

Chih-Ping Lin

Wen-Hsien Liu

A semiconductor structure is provided. The semiconductor structure includes a substrate, a first trench, and a second trench. The substrate has a first region and a second region. The first trench is formed in the substrate within the first region. The first trench is surrounded by a first protrusion structure having a top portion and sidewalls. The second trench is formed in the substrate within the second region. The second trench is surrounded by a second protrusion structure having a top portion and sidewalls. The second trench is deeper than the first trench. The connection portion between the top portion and the sidewalls of the second protrusion structure has a greater radius of curvature than the connection portion between the top portion and the sidewalls of the first protrusion structure.

Semiconductor structures and fabrication method thereof

A method for forming an isolation structure of a semiconductor device is provided. The method includes forming a patterned dielectric structure in a first area and a second area of a substrate; forming a first isolation structure in the first area and forming a second isolation structure in the second area of the substrate; forming a cap layer over the first area and the second area of the substrate and performing an etching process to etch the cap layer of the second area completely; and performing an oxidation process on the second area to form a first oxide region over the second isolation structure and under the bottom surface of the patterned dielectric structure of the second area.

Methods for forming the isolation structure of the semiconductor device and semiconductor devices

A semiconductor device fabricating method is described. The semiconductor device fabricating method includes providing a substrate. A first gate insulating layer and a second gate insulating layer are formed on the substrate, respectively. A gate layer is blanketly formed. A portion of the gate layer, the first gate insulating layer and the second gate insulating layer are removed to form a first gate, a remaining first gate insulating layer, a second gate and a remaining second gate insulating layer. The remaining first gate insulating layer not covered by the first gate has a first thickness, and the remaining second gate insulating layer not covered by the second gate has a second thickness, wherein a ratio between the first thickness and the second thickness is about 10 to 20. A pair of first spacers and a pair of second spacers are formed on sidewalls of the first gate and the second gate, respectively.

Growing community of inventors

Hsinchu, Taiwan

Po-Sheng Hu