Nano and Advanced Materials Institute Limited

Ap Infosense Limited

Po Shan Chan

Kai Ming Yeung

Mui Chan

Yongwoo Park

Qi Lang

Kam Chiu Lau

Man Wai Cheng

Sin Man Lee

Fei Yeung

A three-dimensional profiler includes a broadband radiation source. An interferometric system receives the radiation and includes first and second beam splitters, a moving time delay-inducing reflector, and a stationary reflector. The interferometric system creates a time-delayed optical sample radiation source and an optical reference incident radiation source with the first beam splitter. A stationary sample holder receives the optical sample incident radiation. A reference plane receives the optical reference incident radiation. A detector receives an interference signal from reflected or scattered optical sample radiation and reflected or scattered optical reference radiation. A processor extracts an optical path difference between the reference plane and the sample and reconstructs a three-dimensional morphology of the sample.

Broadband profiler system and method for constructing a three-dimensional profile of a target

A time-temperature indicator (TTI) uses polymer hardening properties to 'set' or retain indications of temperature history. The TTI includes a mesh layer affixed to a thermo-conductive adhesive layer and a photonic crystal patterned film affixed to the mesh layer. The photonic crystal shows a property of bandgap shift vs temperature and responds to a predetermined range of temperatures to provide a visible indication of the range of temperatures. A hardener pouch is affixed to one end of the mesh layer and releases hardener in response to an initiating event, so that the photonic crystal material responds to the hardener by presenting a fixed state.

Time temperature indicator by chromatography and photonic lattice changes

Growing community of inventors

Hong Kong, China

Po Shan Chan