Realtek Semiconductor Inc.

Po-Juei Chen

Chun-Yi Kuo

Pei-Ying Hsueh

Chien-Mo Li

A systematic defect analyzing method, includes: partitioning physical sites into groups to obtain a plurality of groups of physical sites according to a plurality of physical features of a chip corresponding to different potential systematic defects; utilizing a processor to compute at least one defect probability of each group of physical sites; and deriving an analysis result according to the plurality of defect probabilities corresponding to the plurality of groups of physical sites.

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Taipei, Taiwan

Po-Juei Chen