Western Digital Technologies, Inc.

Sandisk Technologies Inc.

Piyush Anil Dhotre

Arun Thandapani

Divya Prasad

Sahil Sharma

Phil Reusswig

Dharmaraju Marenahally Krishna

Chittoor Devarajan Sunilkumar

Thendral Murugaiyan

Nian Niles Yang

Niles Yang

Rohit Sehgal

Sateesh Desireddi

Gopu S

Sainath Viswasarai

Aneesh Puthoor

Swaroop Kaza

Bhavadip Bipinbhai Solanki

Narayan K

Suman Tenugu

Anantharaj Thalaimalai Vanaraj

Chittoor Devarajan Sunil Kumar

Dharmaraju Marenhally Krishna

A storage system and method for boundary wordline data retention handling are provided. In one embodiment, the storage system includes a memory having a single-level cell (SLC) block and a multi-level cell (MLC) block. The system determines if the boundary wordline in the MLC block has a data retention problem (e.g., by determining how long it has been since the boundary wordline was programmed). To address the data retention problem, the storage system can copy data from a wordline in the SLC block that corresponds to the boundary wordline in the MLC block to a wordline in another SLC block prior to de-committing the data in the SLC block. Alternatively, the storage system can reprogram the data in the boundary wordline using a double fine programing technique.

Storage system and method for boundary wordline data retention handling

A memory apparatus and method of operation is provided. The apparatus includes a plurality of memory cells coupled to a control circuit. The control circuit is configured to receive data indicating a data state for each memory cell of a set of memory cells of the plurality of memory cells and program, in multiple programming loops, the set of memory cells according to the data indicating the data state for each memory cell of the set of memory cells. The control circuit is further configured to determine that the programming of the set of memory cells is in a last programming loop of the multiple programming loops and in response to the determination, receive data indicating a data state for each memory cell of another set of memory cells of the plurality of memory cells.

Detection of a last programming loop for system performance gain

Apparatuses, systems, methods, and computer program products for enhanced erase retry of a non-volatile storage device are disclosed. An apparatus includes a non-volatile storage device and a controller. A controller includes a verification component configured to detect that an erase operation performed on an erase block of a non-volatile storage device is unsuccessful. A controller includes a parameter component configured to adjust one or more erase parameters for an erase operation. One or more erase parameters may be associated with one or more select gate drain storage cells of an erase block. A controller includes an erase component configured to retry an erase operation on an erase block with one or more adjusted erase parameters.

Enhanced erase retry of non-volatile storage device

Non-volatile memory and processes for reprogramming data posing a potential reliability concern are provided. A process is provided for distinguishing between cross-temperature effects and read disturb effects as part of determining whether to perform a maintenance operation such as reprogramming. A process is provided that compensates for cross-temperature effects while testing to determine whether to perform a maintenance operation. Applying temperature compensation attempts to remove cross-temperature effects so that testing accurately detects whether read disturb has occurred, without the effects of temperature. By reducing cross-temperature effects, maintenance operations can be more accurately scheduled for memory that has experienced read disturb, as opposed to cross-temperature effects.

Dynamic read table block filter

Apparatuses, systems, methods, and computer program products for programming an unprogrammed upper page based on lower page programming are disclosed. An apparatus includes a non-volatile storage device and a controller. A controller includes a data component that is configured to receive a write request for a first page of a set of multi-level storage cells of a non-volatile storage device. A set of multi-level storage cells includes a first page and a second page. A controller includes a page component that is configured to determine that a write request does not comprise data for at least a portion of a second page of a set of multi-level storage cells. A controller includes a write component that is configured to program at least a portion of a second page of a set of multi-level storage cells with data of a first page of a set of multi-level storage cells.

Programming unprogrammed upper page during lower page programming of multi-level storage cells

A storage system and method for marginal write-abort detection using a memory parameter change is provided. In one embodiment, a method for detecting a write abort is provided that is performed in a storage system having a memory. The method comprises reading a lower page in memory; determining if any data is written in the lower page; and in response to determining that no data is written in the lower page: increasing source voltage for memory cells in the lower page; re-reading the lower page; determining if a read failure exists in the re-read lower page; and in response to determining that a read failure exists in the re-read lower page, detecting a write abort. Other embodiments are possible, and each of the embodiments can be used alone or together in combination.

Storage system and method for marginal write-abort detection using a memory parameter change

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Bengaluru, India

Piyush Anil Dhotre