Picker International, Inc.

Piotr J Maniawski

Stephen D Miller

Hugh T Morgan

Gary G Jarkewicz

Radiation indicative of an object being imaged is detected and a data set indicative of the detected radiation is generated. Negative cells within the data set are located and ordered for processing. A negative cell is selected for processing. A mask region is defined in relation to the selected cell, and positive cells within the mask region are identified. A correction factor is determined, the value of the positive cells is adjusted accordingly. The value of the selected cell is also adjusted so that the count value of the data set remains constant. If the value of the selected cell is still negative, new correction factors are determined and the values of the positive cells and the selected cell are again adjusted. The process is repeated until all of the negative cells within the data set have been processed. An image indicative of the object is then generated.

Negativity bias reduction

A method of scatter correction for use with gamma cameras includes the steps of detecting and producing a first count value indicative of gamma radiation falling within a first energy range generally associated with a radionuclide photopeak. Gamma radiation falling within second and third energy ranges is also detected and a corresponding count produced. The second and third ranges are above and below the photopeak, respectively. The location of the second and third energy ranges is determined based on the energy resolution of the gamma camera such that a predetermined percentage of the radiation falling within the second and third ranges results from primary radiation. The second and third energy ranges may be located such that they are non-contiguous with the first energy range. Based on the count of radiation falling within the second and third ranges, the scatter radiation falling within the first energy range can be estimated, and the first count value corrected. The method is suitable for use with radionuclides having multiple closely spaced photopeaks as well as with multiple widely spaced photopeaks.

Growing community of inventors

Mayfield Hts., OH, United States of America

Piotr J Maniawski