Intel Corporation

Ping Sun

Jiangqi He

Hyunjun Kim

Xiang Yin Zeng

Andrew McRonald

Brett Neal

Lee Genz

Neal Meyer

Gene Garrison

Dong-Ho Han

Joong-Ho Kim

Some embodiments provide identification of a first polyline and a second polyline associated with a differential signal, determination of whether a distance between a segment of the first polyline and a segment of the second polyline is within a first tolerance, determination, if the distance is not within the first tolerance, of whether the distance is within a second tolerance, determination, if the distance is not within the first tolerance and is within the second tolerance, of whether the length of the segment of the first polyline is less than a first threshold, and to indicate that the first polyline and the second polyline are sufficiently spaced, if the distance is not within the first tolerance and is within the second tolerance, and if the length of the segment of the first polyline is less than the first threshold.

Checks for signal lines

Design checks for signal lines

An apparatus for filtering noise from an input/output (I/O) signal is disclosed. In various embodiments, the apparatus may be an array capacitor, and may be disposed between an electronic package and an underlying substrate such as a printed circuit board.

Array capacitor apparatuses to filter input/output signal

Extending high k material of a second dielectric layer to surround at least one thru-via designed to provide a signal other than a power signal to a die may eliminate discrete AC coupling capacitors to reduce cost and improve performance of the package.

Extended thin film capacitor (TFC)

An apparatus comprises a signal layer including a first and second signal trace. The apparatus also comprises a first reference plane including a first slot substantially parallel to the first and second signal traces. Further, the apparatus includes a dielectric layer having at least a portion disposed between the signal layer and the first reference plane.

Reference slots for signal traces

A system to evaluate a distance between polyline segments includes identification of a first polyline and a second polyline associated with a differential signal, determination of whether a distance between a segment of the first polyline and a segment of the second polyline is within a first tolerance, and, if the distance is not within the first tolerance, determining whether the distance is within a second tolerance. If the distance is not within the first tolerance and is within the second tolerance, it is determined whether the length of the segment of the first polyline is less than a first threshold. If the distance is not within the first tolerance and is within the second tolerance, and if the length of the segment of the first polyline is less than the first threshold, it is indicated that the first polyline and the second polyline are sufficiently spaced. If the distance is not within the second tolerance or if the length of the segment of the first polyline is greater than the first threshold, it is determined whether the segments are located near a device pin, and, if the segments are not located near a device pin, it is indicated that the first polyline and the second polyline are not sufficiently spaced.

Growing community of inventors

Gilbert, AZ, United States of America

Ping Sun