Mediatek Corporation

Ping-Hsuan Tsu

Chun-Hsien Peng

Chun-Nan Chen

Chun-Yu Lin

Yuan-Hwui Chung

Chung-Chin Tsai

Pei-Wei Chen

ChiaYu Yang

An integrated circuit (IC) is provided. The IC includes an RF transmitter and an RF receiver. The RF transmitter is configured to generate an RF signal in response to an analog test signal from a test signal generator of a module circuitry that is external to the IC. The RF receiver is configured to generate an outgoing signal according to an input RF signal, and to report the outgoing signal to the module circuitry. The module circuitry performs a test analysis on the RF signal generated by the RF transmitter or on the outgoing signal generated by the RF receiver to determine a test result. The test result is reported to a test equipment having no RF instruments.

RF testing system using integrated circuit

A GNSS receiver having an IF process engine is disclosed. The IF process engine provides a plurality of carriers with different frequencies and down converts IF signals into baseband signals by using the carriers in a time division multiplex (TDM) schedule. The IF process engine has a local oscillator part for generating the carriers with different frequencies; an IF down-converter for respectively mixing the IF signal with the carriers generated by the local oscillator part to generate IF removed signal segments; a time division multiplex (TDM) controller for scheduling the respective mixing operations of the IF down-converter for the IF signal with the respective carriers; and a buffer for storing the IF removed signal segments generated by the IF down-converter.

If process engine and receiver having the same and method for removing if carriers used therein

An IC, a circuitry, and an RF BIST system are provided. The RF BIST system includes a test equipment, a module circuitry, and an IC. The IC is arranged to communicate with the module circuitry by an RF signal in response to a command signal from the test equipment, determine a test result by the RF signal, and report the test result to the test equipment, wherein the module circuitry is external to the IC and the test equipment.

IC, circuitry, and RF BIST system

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Taipei, Taiwan

Ping-Hsuan Tsu