Average Co-Inventor Count = 3.39
ph-index = 15
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. J.a. Woollam Co. (68 from 211 patents)
2. Other (5 from 832,891 patents)
3. J.a. Woollan Co., Inc. (2 from 2 patents)
4. J.a. Wooliam Co., Inc. (2 from 2 patents)
5. James D. Welch (1 from 1 patent)
78 patents:
1. 12405210 - System for, and calibration and testing of directed beam ellipsometer systems
2. 12332163 - System for, and calibration and testing of directed beam ellipsometer systems
3. 11885738 - Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meet the scheimpflug condition and overcomes keystone error
4. 11675208 - Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system
5. 10989601 - Beam focusing and reflective optics
6. 10859439 - Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meets scheimpflug condition and overcomes keystone error
7. 10627288 - Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multielement detector, while maintaining information content therein
8. 10612976 - Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multi-element detector, while maintaining information content therein
9. 10338362 - Beam focusing and reflecting optics with enhanced detector system
10. 10247611 - Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms
11. 10066989 - Information maintenance, intensity attenuation, and angle/plane of incidence control in electromagentic beams
12. 10061068 - Deviation angle self-compensating substantially achromatic retarder
13. 10018815 - Beam focusing and reflective optics
14. 9933357 - Elliposometer system with polarization state generator and polarization state analyzer in environmental chamber
15. 9921395 - Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area