Consiglio Nazionale Delle Ricerche

United Technologies Corporation

Fondazione Istituto Italiano Di Tecnologia

Finmeccanica S.p.a. - Ramo Aziendale Alenia

Pietro Ferraro

Andrea Finizio

Simonetta Grilli

James R Dunphy

Gerald Meltz

Mauro Varasi

Antonello Vannucci

Mario Signorazzi

Sergio De Nicola

Giuseppe Coppola

Claudio Voto

Melania Paturzo

Veronica Vespini

Sara Coppola

Raffaele Vecchione

Paolo Netti

Riccardo Meucci

Mario Iodice

Sabato I Imparato

Sabato Inserra Imparato

Giovanni Pierattini

Bahram Javidi

Pasquale Poggi

Anna Pelagotti

Andrea Giovanni Geltrude

Eugenio Pugliese

Massimiliano Locatelli

Lisa Miccio

Vittorio Bianco

Eliana Esposito

Paolo Antonio Netti

There is described a method for making an array of micro-needles, comprising the steps of:

Method for making an array of micro-needles

Disclosed a system for reconstructing an image of an object hidden by a flame. The system comprises a laser source emitting an infrared radiation and a lensless, off-axis interferometric arrangement that divides the infrared radiation into an object beam and a reference beam. The object beam is enlarged and then irradiates the object, that scatters it. The reference beam is enlarged and then interferes with the scattered object beam, so as to create a hologram. The system comprises an infrared detector which detects the hologram and a processor that reconstructs the image of the object by numerically processing the hologram.

Reconstruction of an image of an object at least partially hidden by a flame

Production and the distribution of pico and nano-drops, which are extracted by the effect of a strong electric field generated by pyroelectric effect, in particular, but not exclusively, from a sessile drop (a drop placed on a surface assumes a form termed 'sessile') or by a liquid film, and distributed on a dielectric substrate. The electric field is advantageously generated applying a heat source on the dielectric substrate or utilizing a laser source emitting in the infrared region. In this new approach, it is not necessary to use fixed electrodes, circuits, high tension generators or to design intentionally, and therefore to realize, pico- and nano-nozzles.

Device for controlled distribution of micro- or nano-volumes of a liquid based on the piezoelectric effect in functionalized materials, without using external electric sources

A holographic method with numerical reconstruction for obtaining an image of a three-dimensional object, employs a digitalized hologram of an object or of a portion thereof, and includes starting from the digitalized hologram, extracting a phase image of the object corresponding to a matrix MD of distance values, selecting a subassembly SD of the distance value assembly present in matrix MD, subassembly SD containing distance values d, extracting from matrix MD an iso-level assembly IQdof corresponding bidimensional coordinate of the object; reconstructing, for each distance value d, a bidimensional matrix IMdof intensity values relevant to the object; extracting, from each bidimensional matrix IMd, a bidimensional IFdof intensity values; and starting from the intensity values, reconstructing the three-dimensional intensity image of the object.

Holographic method with numerical reconstruction for obtaining an image of a three-dimensional object in which even points out of the depth of field are in focus, and holographic apparatus using such a method

Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials with a single measurement operation. The system employs an interferometer as a 'shear interferometer' with the advantage of varying the wavelength of the luminous source. The index of refraction and the thickness are determined in two phases. Firstly it is determined the optical path analyzing the displacement of interferometric signal obtained by orthogonal incidence; successively, by means of phase recovery techniques and the previously determined optical path value, it is possible to obtain the index of refraction of the material. From the knowledge of the index and of the optical path it is obtained the material thickness.

Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure

A system based on integrated optical technologies for the measurement and diagnostics of physical parameters on whatever structure, by the use of optical sensors, made by the fiber embedded Bragg grating method and by the use of a planar integrated optics device for the analysis of the optical signal. The sensors may be embedded or bonded to the structure, allowing the measurement of parameters like strain and temperature, in either a static or dynamic regime. The system pertains to the technical field of the diagnostics and measurements of mechanical or thermal parameters and to the application field of ground, water and aerospace transportation and also to the application field of construction.

Integrated optical instrumentation for the diagnostics of parts by

An embedded optical sensor has a plurality of layers 10-20 and an optical fiber 21 with a fiber grating 28, disposed between the layers 14,16. The layers 10-20 comprise filaments 22 and resin 24 which have different thermal expansion coefficients and the filaments 22 are oriented so as to create unequal transverse residual stresses that act through the geometry of a resin-rich region that surrounds on the grating 28 in the fiber 21. The unequal transverse residual stresses cause birefringence in the grating 28, thereby causing the grating 28 to reflect light 32 having two wavelengths with a predetermined separation, each along a different polarization axis. The wavelength separation and average wavelength between such separation have different sensitivities to temperature and strain, thereby allowing independent temperature and strain measurements using only a single grating. The birefringence is maximized when the filaments 22 of the adjacent layers 10,12 are oriented at 90 degrees with respect to the longitudinal (Z-axis) of the fiber 21.

Embedded optical sensor capable of strain and temperature measurement

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Naples, Italy

Pietro Ferraro