Qcify Inc.

Pieter Boogaerts

Raf Peeters

Joachim Van Der Perre

Bert Switten

Antoon De Cleen

Pieter Ieven

Jef De Busser

Simon Kerkhofs

A process includes receiving a target quality value, receiving a measured quality value, receiving a source quality value, and sending a source control instruction. The source control instruction is based at least in part on the target quality value, the measured quality value, and the source quality value. The target quality value, the measured quality value, the source quality value, and the source control instruction are communicated via the communication port. The measured quality value is generated by an inspection device configured to inspect a sample. The source quality value is associated with a quality level of a first group of samples. The target quality value indicates a desired quality value of an output group of samples. The source control instruction causes a source selecting device to select one of a plurality of groups of samples, each group having identified quality characteristics.

Product target quality control system

An adaptable inspection and sorting unit includes an attachment mechanism, an inspection sensor device that is capable of inspecting a sample, a sorting device that is capable of deflecting the sample, a data port that is capable of receiving information, and a power port that is connectable to a power source. The attachment mechanism, the inspection device, the sorting device, the data port, and the power port are physically connected together. A memory circuit and a processor circuit read information received via the data port, control the inspection sensor device, and control the sorting device. The adaptable inspection and sorting unit is capable of inspecting and deflecting a sample traveling along the processing line. The speed of the sample is measured utilized to determine a delay between inspecting the sample and sorting the sample.

Adaptable inspection and sorting unit

A process includes receiving a target quality value, receiving a measured quality value, and sending an inspection control instruction. The inspection control instruction is based at least in part on the target quality value and the measured quality value. The measured quality value is generated by a product inspector configured to inspect a sample before being sorted and may also include data generated by an output product inspector configured to inspect a sample after passing a sorting phase. The target quality value indicates a desired quality value of an output group of samples. The inspection control instruction controls the method of inspection performed by the product inspector. The measured quality values are received by a computing device, which in turn outputs the inspection control instruction to a product inspector.

Product target quality control system with intelligent sorting

A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.

Quality inspection data distributed ledger

A sub stream auto sampling system includes an inspection unit and a sorter unit. The inspection unit includes a camera configured to capture an image of a sample, a light configured to illuminate a sample, a processor configured to process the captured image, and a memory configured to store the captured image. The sorter unit is configured to divert a sub stream of samples, from a main stream of samples, toward the inspection unit. The output of the inspection unit may be directed to the main stream of samples, or the output of the inspection unit may be directed to a collection unit. In addition to the inspection performed by the inspection unit, weighing of the sub stream of samples may also be performed by a weighing unit before the sub stream of samples are routed to the main stream of samples or the collection unit.

Sub stream auto sampling

An adaptable sorter unit includes an attachment mechanism, a device that is capable of moving a first sample by use of a vacuum, a pressurized air inlet, and a valve. The pressurized air inlet is connected to the valve that controls a flow of pressurized air through the device. The valve may be electronically controlled or pneumatically controlled. The location of the adaptable sorter unit may be adjustable based, at least in part, on data captured by an optical inspector. An array of adaptable sorter units may be configured side-by-side to cover the width of the processing line. The device may be a venturi vacuum. The adaptable sorter unit may include a baseline vacuum control valve that causes a baseline vacuum force to be applied. An electrical control signal may be used to open the valve, the frequency of which may control the amount of time the valve is opened.

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Sint-Katelijne-Waver, Belgium

Pieter Boogaerts