X-Fab Semiconductor Foundries Ag

Melexis Tessenderlo N.v.

Melexis Nv Microelectronic Integrated Systems

Q-Star Test N.v.

Piet De Pauw

John Nigel Ellis

Hans Manhaeve

A semiconductor device including a first transistor in a substrate, a second transistor in the substrate, and a further device in the substrate. The second transistor and the further device are arranged to operate at a second voltage which is higher than a first voltage. The first voltage is the (normal) voltage of operation of the first transistor, and the first transistor is isolated from the second voltage.

Semiconductor device

An optical data transceiver is manufactured by forming an integrated control circuit () on a suitable substrate, such as a silicon wafer, and then mounting said integrated circuit () onto the lead frame (). Electrical connections may then be made between said integrated circuit () and said lead frame (). The combined assembly comprising the integrated circuit () and lead frame () is then inserted into the cavity of a mold tool (not shown). A suitable molding compound is injected to encapsulate the combined assembly. The mold tool is provided with a projection (not shown) that is in contact with a portion of the surface of the integrated circuit () when the assembly is in the mold tool. As a result, the opening (), exposing that portion of the surface of the integrated control circuit () that was in contact with the projection of the mold tool, is provided. The cavity of the mold tool is also adapted so as to form a rim () around the opening () during the encapsulation process. After the encapsulation process is complete, an optically active element () is then connected to the integrated circuit ().

Optical data transceivers

The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current I, to said device, wherein each Imeasured value is divided by another Ivalue, and wherein the result of said division is compared to a predefined reference, resulting in a pass or fail decision for said device.

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Oudenaarde, Belgium

Piet De Pauw