Olympus Ndt

Olympus Scientific Solutions Americas Corp.

Pierre Langlois

Michael Drummy

Benoit Lepage

Andrew Thomas

Jason Habermehl

Steven Besser

Martin St-Laurent

Agostino Abatte

Josefina R Quiles, Legal Representative

Denys Laquerre

Benoit Cournoyer

David Larochelle

Benoît Lepage

Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.

System and method of non-destructive inspection with a visual scanning guide

Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.

Ultrasonic testing instrument with dithery pulsing

The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.

Detection of channel saturation in phase-array ultrasonic non-destructive testing

The present invention relates to a flaw detector imaging apparatus for detecting and visualizing a flaw in a target material to be investigated, comprising an ultrasonic phase-array probe comprising an array of ultrasonic transducers and a flaw detector. The flaw detector includes at least one trigger channel to trigger ultrasonic emitting transducers of the array at respective time delays to produce an ultrasonic beam propagating through the target material, and a single receiver channel to receive echo signals produced by ultrasonic receiving transducers of the array in response to ultrasonic wave echoes reflected from a flaw in the target material. The single receiver channel comprises a delay circuit imparting to the received echo signals the respective time delays as used in the triggering of the ultrasonic emitting transducers and a combiner of the delayed echo signals. A processor is responsive to the echo signals produced by the ultrasonic receiving transducers, received by the single receiver channel and time delayed by the delay circuit to produce an image of the flaw from which the ultrasonic wave echoes are reflected. A display connected to the ultrasonic processor displays the image of the flaw.

Hand-held flaw detector imaging apparatus

A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.

Multiple mode digitization system for a non-destructive inspection instrument

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Pierre Langlois