Micron Technology Incorporated

Pierre Labat

Nabeel Meeramohideen Mohamed

Steven Moyer

A system includes a memory device, and a processing device, operatively coupled with the memory device, to perform operations including detecting a failure of a key-value store, identifying a non-filled zone of the memory device resulting from the failure, wherein the non-filled zone stores, in the key-value store, at least one of: an uncommitted key block or an uncommitted value block, and recovering the non-filled zone to obtain a recovered zone.

Zoned memory device recovery after a key-value store failure

A system and method for reordering data blocks received from a zone of a memory device. An example method includes sending, by a host system to a memory sub-system comprising a memory device, a plurality of write commands; receiving, by the host system from the memory sub-system, block allocation metadata, wherein the block allocation metadata references one or more locations in the memory device corresponding to a zone; generating, by the host system, a reorder map based on the block allocation metadata; reading a plurality of data blocks associated with the zone; and reordering, by the host system, the plurality of data blocks based on the reorder map.

Preserving application data order in memory devices

A system includes a zoned memory device allocating a zone storing a block belonging to a key-value set, and a processing device, operatively coupled with the zoned memory device, to perform operations including obtaining zone status information associated with the zone, identifying that the zone is a non-filled zone in view of the zone status information, and recovering the non-filled zone to obtain a recovered zone.

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Campbell, CA, United States of America

Pierre Labat