Commissariat a L'energie Atomique Et Aux Energies Alternatives

Centre National De La Recherche Scientifique

Commissariat a L'energie Atomique

Pierre Bleuet

Christophe Constancias

Régis Guillemaud

Tony Printemps

Denis Jalabert

Nicolas Martin

Isabelle Magnin

Method of determining a rotation axis of an object during acquisition of projections obtained by a tomography characterization system, comprising the following steps, starting from said projections:

Method of determining a rotation axis of an object in tomography and characterisation method by tomography

In the field of resolution test charts for analysis of the resolution of X-ray tomography systems, a test chart comprises a substrate bearing X-ray absorbent zones, with widths and spacings to allow measurement of the system resolution. To avoid shadow effects when the X-ray illumination beam is divergent and when the absorbent zones have a large height/width ratio (from 2 to 5 for example), the absorbent zones in the diverse points of the pattern have a shape of which a general direction of elevation with respect to the surface of the substrate is rotated toward a point of convergence which is the same for all absorbent zones. The X-ray source is placed at the convergence point, eliminating shadow effects. The oblique elevation can be obtained by specific etching steps, or curvature of the substrate after fabrication of the absorbent patterns, or else by use of two superimposed partial test charts.

Resolution test chart for X-ray imaging system and method of fabrication

A source of X-rays, and imaging device, and an imaging process are provided, including a source of electrons generating an electron beam of nanometric size and a target, the target being designed to send out an X-ray beam upon illumination by the electron beam, the target including one nanowire, for example made of silicon, and a nanowire catalyst, for example made of gold, covering the free end of the nanowire.

Source of X-rays generating a beam of nanometric size and imaging device comprising at least one such source

An imaging system intended for imaging fast-moving objects, comprising an X-ray source, a scintillating screen, a shutter and a detector of the beam emitted by the shutter, and a processing unit connected to the detector, where the shutter is positioned between the scintillator screen and the detector, and a support for the object to be observed is positioned downstream from the X-ray source and upstream from the scintillator screen, where the shutter is a shutter which can be controlled at high frequencies, for example higher than approximately 1 kHz, where the shutter is fixed and the transmission of the signal originating from the scintillator screen towards the detector is controlled by electrical polarization means controlled by a control unit.

Imaging system for imaging fast-moving objects

The invention relates to a tomosynthesis method by illuminating an object by means of an X-ray source () with a linear trajectory (), the method comprising breaking down a volume of the object into N fanned out planes (P) formed between the linear trajectory () and a detecting plane () parallel to the linear trajectory, each fanned out plane of said N planes includes the linear trajectory; and performing anisotropic regularization on at least one fanned out plane (P).

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Seyssins, France

Pierre Bleuet