Cadence Design Systems, Inc.

Phung Truong

Mitchell Grant Poplack

Xiaolei Guo

Justin Schmelzer

A system for testing of one or more electronic devices is disclosed. In an embodiment, a processor transmits one or more test vectors to the one or more electronic devices. The one or more test vectors are based upon configuration parameters of the processor and input-output parameters of the one or more electronic devices. The processor receives scan vectors from the one or more electronic devices in response to the plurality of test vectors. The processor verifies in-system behavior of the one or more electronic devices based upon comparing received scan vectors with expected scan vectors.

In-system scan test of electronic devices

An emulation system may include an emulator. The emulator may include at least one chip and at least one FPGA. The chip may be associated with the FPGA. The FPGA may operate as a coprocessor to implement in-system scan test of the chip. In a scan mode of the in-system scan test, the coprocessor may transmit one or more in-system test instructions to the chip through its existing connections with the chip. The coprocessor may capture test response data from the chip in response to the one or more in-system test instructions through its existing connections with the chip. In an offline mode, the coprocessor may compare the test response data with expected response data to determine if the chips are functioning correctly.

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San Jose, CA, United States of America

Phung Truong