Georgia Tech Research Corporation

Phillip N First

Walt A DeHeer

Claire Berger

Thomas Michael Orlando

Elliot Christian Frey

Zhigang Jiang

A radiation detector () includes an insulating substrate (), which includes a material that undergoes a change in an electrical property when subjected to ionizing radiation. A conductive film () is disposed in relation to a surface of the substrate. The conductive film () has a resistance that is a function of a state of the electrical property. A resistance measuring device measures resistance across the conductive film (). The resistance measured by the resistance measuring device indicates an amount of ionizing radiation to which the substrate () has been subjected. In a method of determining exposure to a type of radiation, a boron nitride substrate is exposed to a radiation environment. A resistance is measured across a conductive film disposed in relation to the boron nitride substrate. Radiation exposure is calculated as a function of the resistance.

Electrical resistance device for radiation detection

In a method of making graphite devices, a preselected crystal face of a crystal is annealed to create a thin-film graphitic layer disposed against selected face. A preselected pattern is generated on the thin-film graphitic layer. A functional structure includes a crystalline substrate having a preselected crystal face. A thin-film graphitic layer is disposed on the preselected crystal face. The thin-film graphitic layer is patterned so as to define at least one functional structure.

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Doraville, GA, United States of America

Phillip N First