Skf Condition Monitoring Inc.

Phillip L Maness

Johannes Izak Boerhout

John T Barclay

Wane D Wier

Leroy R Bannach

Hoa Nguyen

A vibration data processor and processing method uses a frequency domain filter having low pipeline delay and accurate time domain signal reconstruction. The filter may be user configurable, and the filter may receive input data from a variable number of decimation stages. Sequences of extracted vibrational features are routed to a variable length output buffer for event detection.

Vibration data processor and processing method

A method and system for monitoring the operational condition of a machine is disclosed. The system includes: a test probe configured to be coupled to the machine for measuring an operational parameter of the machine and for outputting a test signal representative of the measured operational parameter; a fault condition detection circuit, coupled to the test probe, for receiving and processing the test signal so as to detect a fault condition of the machine; a probe failure detection circuit, coupled to the test probe, for receiving the test signal and detecting a failure condition of the test probe if the test signal is not within defined limits, wherein the probe failure detection circuit provides a data path that is separate from the fault condition detection circuit; and a processor, coupled to the fault condition detection circuit and the probe failure detection circuit, for initiating a defined action in response to signals received from the fault condition detection circuit and the probe failure detection circuit. The method includes the following acts: measuring an operational parameter of the machine with a probe coupled to the machine; outputting a test signal representative of the measured operational parameter; providing the test signal to a machine fault detection circuit for processing; determining whether the test signal indicates that a machine fault condition exists; providing the test signal to a probe failure detection circuit; determining whether the test signal indicates a probe failure condition exists, wherein the probe failure detection circuit operates independently of the machine fault detection circuit; and initiating a defined action if it is determined that a machine fault condition exists and a probe failure condition is not detected.

Method and system for fast probe failure determination

The output of an eddy current probe is demodulated and subsequently linearized using an analog to digital converter, a digital signal processor, and a memory. The linearized digital output signal is converted back to an analog signal, the voltage of which is preferably directly proportional to the position of the conductive target in relation to the probe.

Growing community of inventors

El Cajon, CA, United States of America

Phillip L Maness