Intel Ndtm US LLC

Phillip Kliza

Andreas Kerber

Methods and apparatus for a diagnostic in situ ring oscillator (RO) circuit for DC and transient characterization. The RO circuit includes a plurality of symmetrical stages coupled via an RO feedback signal line and forming an inverter chain, where each stage includes a CMOS inverter comprising a pair of pMOS and nMOS transistors coupled between power-gating transistors respectively coupled to a positive voltage source and ground, wherein an output of a CMOS inverter for the stage is coupled to an input for the CMOS inverter of a next stage. The first stage is a configurable enable stage to enable the inverter chain to be set into a defined logic state, followed by multiple pre-stage-DUT stages. The output of the last stage is feed back to the input of the enable stage to form an RO feedback signal. The RO circuit can operate in multiple modes including an AC mode, a DC mode, and a hybrid mode.

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Palo Alto, CA, United States of America

Phillip Kliza