Tektronix, Inc.

Phillip D Applebee

Mark W Nightingale

William Q Law

David W Simmen

R Kenneth Price

Carl R Matson

A measurement test instrument voltage management system for an accessory device has a accessory device interface that provides a voltage to a memory device in the accessory device. A sensing signal is generated when the accessory device is connected to the interface that causes an interrupt signal to be coupled to a controller. The controller retrieves accessory device data stored in the device memory via the interface and determines if the connected accessory device is a valid device capable of being supported by the measurement test instrument and voltage power requirements for the accessory device. The controller generates an enable signal for a valid and supported device that is coupled to a voltage switching circuit. The voltage switching circuit generates at least a first output voltage based on the voltage power requirements that is coupled to the accessory device via the interface to provide power to the accessory device.

Measurement test instrument and associated voltage management system for accessory device

An attachable/detachable probe point for use with an electrical measurement probe includes a base having a aperture formed therein that extends through the base. An electrically conductive probing contact having at least a partially threaded body member and a pointed contact member is disposed in the aperture with a portion of the body member extending from the top surface of the base and the pointed contact member extendable from a first position within the aperture to a second protruding position outside the aperture at the bottom surface of the base. A compliant adhesive material formed on the bottom surface of the base for securing the attachable/detachable probe point to probing contact point.

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Canby, OR, United States of America

Phillip D Applebee