Centre National Detudes Spatiales

Credence Systems Corporation

Dcg Systems Gmbh

Philippe Perdu

Romain Desplats

Steven Kasapi

William K Lo

Patricia Le Coupanec

Olivier Crepel

Felix Beaudoin

Theodore R Lundquist

Ketan Shah

Kenneth R Wilsher

Praveen Vedagarbha

Félix Beaudoin

Martin D Leibowitz

A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

Apparatus and method for detecting photon emissions from transistors

A device () used to measure at least one component of a magnetic field, includes a magnetoresistive sensor () and a measuring chain (). The input of the measuring chain is connected to the magnetoresistive sensor (), while the output thereof is intended to supply information that is representative of the magnetic field in the region of the sensor. In addition, the measuring chain () includes elements () for isolating a frequency component of the signal from the sensor representative of the magnetic field for a unique pre-determined frequency (FI).

Magnetic-field-measuring device

A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors () which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.

Magnetic-field-measuring probe

A magnetic-field-measuring probe includes at least two magnetoresistive sensors which are sensitive to respective magnetic fields along a determined measurement axis. The at least two magnetoresistive sensors are rigidly connected to one another in a position such that the measurement axes thereof are at an angle other than zero. Output terminals specific to each magnetoresistive sensor are used to supply a signal that is representative of the field measured by each sensor along the measurement axis thereof. The difference between the derivative of a first magnetic field relative to a second direction and the derivative of a second magnetic field relative to a first direction is calculated to determine a component of current to be measured.

Device for measuring a component of current based on magnetic fields

A customizing method includes steps which consist in: a) determining on the basis of a circuit model, a set of vectors each corresponding to a theoretical operating time of the circuit when a predetermined sequence of tests is applied, the coefficients of each vector representing the state of a common set of elements of the circuit among which the element to be customized (); b) defining on the basis of a comparison of vectors, a composite of logic operators applied on the vectors and enabling to extract the coefficient corresponding to the element to be customized (); c) producing images of the operating circuit at times corresponding to the vectors whereon is applied the composite of logic operators (); and d) graphically combining the images produced in accordance with a composite of graphic operators corresponding to the composite of logic operators ().

Method for customizing an integrated circuit element

A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.

Spatial and temporal selective laser assisted fault localization

The invention relates to a method and an installation for fast location of a fault in an integrated circuit. A sequence of NRZ location vectors is created, the abnormal location vectors are determined, for which the value of the electrical consumption current at rest IDDQ of the circuit is abnormal, at least one set of images is produced with an abnormal location vector, and at least one abnormal vector image is compared with a reference image.

Method and installation for fast fault localization in an integrated circuit

A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves processing of integrated circuit computer aided design data to identify transistors within the CAD data. The analysis may further involve the use of Boolean operators to process the CAD data to particularly identify, such as through a channel, the location of the NMOS and PMOS gates, the location of the drain and source, or some combination of the location of the gate and drain or source to particularly identify the pinch-off region.

The invention concerns a method for comparing two recorded pixelated source images ( ) of the same rectangular format representing in contrasted form the equipotential lines on an integrated circuit chip. The method consists in subjecting each source image ( ) to an adaptive thresholding processing with three contrast levels, then forming a result image ( ) from the processed source images ( ) by assigning to each pixel a contrast level defined according to a logical rule of comparison.

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Toulouse, France

Philippe Perdu