Nxp Usa, Inc.

Philippe Bernard Roland Lance

Lianjun Liu

David Joseph Monk

Jerome Romain Enjalbert

Jacques Trichet

Volker Dietmar Wahl

Marianne Maleyran

Jalal Ouaddah

Babak A Taheri

A wake-up circuit and method are provided for detecting and preventing false positive wake-up events in an electronic device in a sleep mode. Methodology entails producing first, second, and third sensor signals at successive first, second, and third instants in time in response to a physical stimulus detected by a sensor of the wake-up circuit. The first sensor signal is selected to be a reference value. A first difference value is determined between the second sensor signal land the reference value, a second difference value is determined between the third sensor signal and the reference value, and communication of a wake-up signal to the electronic device is prevented when at least one of the first and second difference values fails to exceed a threshold value.

Wake-up circuit and methodology for reducing false wake-up events

A method for voltage regulation includes reducing a power consumption of a voltage regulator during an IDLE phase, by disabling a feedback loop configured to regulate an internal voltage to a multiple of a reference voltage in response to the voltage regulator receiving a digital signal from a digital circuit. The internal voltage is proportional to an external voltage supplied to the digital circuit. A regulated accuracy of the external voltage is increased during a MEASUREMENT phase by enabling the feedback loop in response to the voltage regulator receiving the digital signal from the digital circuit.

Ultra low power linear voltage regulator

An electric field sensor includes sense and reference cells. The sense cell produces a resistance that varies relative to an intensity of an electric field, and the reference cell produces a resistance that is invariable relative to the intensity of the electric field. An output signal indicative of the intensity of the electric field is determined using the difference between the resistances. A system includes an electric field source that outputs a digital test program as an electric field signal. The system further includes the electric field sensor formed with IC dies on a wafer. The electric field sensor receives the electric field signal. The received electric field signal is converted to the test program, and the test program is stored in memory on the wafer. The electric field source does not physically contact the dies, but can flood an entire surface of the wafer with the electric field signal.

Electric field sensor, system, and method for programming electronic devices on a wafer

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Toulouse, France

Philippe Bernard Roland Lance