Rohde and Schwarz Gmbh & Co. Kg

University of Basel

Universitat Basel

Philipp Treutlein

Thomas Ruster

Melvyn Ho

Yongqi Shi

Theodor W Hansch

Max F Riedel

Pascal Bohi

Theodor W HÄNSCH

Pascal BÖHI

The present disclosure relates to a sensor system for analyzing a spectrum of an electromagnetic, EM, signal. The system includes a vapor cell containing at least one species of atoms in a gaseous form, wherein the atoms in the vapor cell are exposed to the EM signal; at least one excitation source excites a number of atoms in the vapor cell to a Rydberg state, wherein at least a fraction of the excited atoms are ionized; a number of electrode pairs which are arranged along the vapor cell, and which generate a spatially and/or temporally varying electric field in the vapor cell; a current sense circuit detects a current between at least one of the number of electrode pairs, wherein the current is caused by ionized atoms in the vapor cell; and a processor determines spectral information of the EM signal based on the detected current.

Sensor system and method for analyzing a spectrum of an EM signal

A sensor system for sensing EM radiation and a method for calibrating the system are provided. The system includes a sensing element that receives calibration signals or signal components with different frequencies. Recording device records responses of the sensing element to at least two calibration signals or signal components. A respective response to a calibration signal of the at least two calibration signals or signal components depends on an excitation of one or more of the resonances by the calibration signal. A part of the recorded responses to and/or information derived from at least a part of the recorded responses is stored in a model which correlates the responses to frequencies and/or signal levels of the corresponding calibration signals or signal components. Processor uses the model to convert a response of the sensing element to an EM signal to be analyzed into a frequency spectrum of the EM signal.

Sensor system and method for calibrating a sensor system

A device for sensing a microwave magnetic field polarization component (B, B, B) of a microwave relative to a static magnetic field B, comprising a preparation means to prepare atomic vapor () comprising thermal atoms in a first hyperfine state, particularly a dark state to applied laser light, which first hyperfine state is split from other hyperfine state due to zero-field hyperfine splitting and/or due to a static magnetic field (B) generated by preparation means, at least one cell enclosing the thermal atoms (), the microwave is adapted to drive Rabi oscillations of thermal atoms between first hyperfine state and second hyperfine state, Rabi frequency of Rabi oscillations being proportional to magnetic field polarization component (B, B, B) of the microwave, and imaging means to capture state image of plurality of atoms representing spatial atomic density distribution (N) as a function of the Rabi frequency (&#x3a9;(r)) of Rabi oscillations.

Simple microwave field imaging device

Growing community of inventors

Basel, Switzerland

Philipp Treutlein