Analytik Jena Gmbh+co. Kg

Philipp Frederic Schulz

Iouri Kalinitchenko

Wolfram Weisheit

Marcus Großmann

A method for analyzing a sample using a system, wherein the sample is a solid sample comprising a first chemical element and a second chemical element, wherein the system comprises a plasma spectrometer and an analytical device, the method including: determining a concentration of the first chemical element using the analytical device; determining a sensitivity of the plasma spectrometer to the first chemical element and to the second chemical element; measuring a signal intensity of the first chemical element using the plasma spectrometer; measuring a signal intensity of the second chemical element using the plasma spectrometer; and calculating a concentration of the second chemical element using the determined concentration of the first chemical element, the sensitivities to the first chemical element and to the second chemical element, and the signal intensities of the first chemical element and the second chemical element.

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Munich, Georgia

Philipp Frederic Schulz