Rambus Inc.

Philip Yeung

Scott C Best

Richard E Perego

Benedict C Lau

Bret G Stott

Chanh Vi Tran

John Welsford Brooks

Eugene C Ho

A communication channel is operated by storing a calibrated parameter value in nonvolatile memory during manufacturing, testing, or during a first operation of the device. Upon starting operation of the communication channel in the field, the calibrated parameter value is obtained from the nonvolatile memory, and used in applying an operating parameter of the communication channel. After applying the operating parameter, communication is initiated on a communication channel. The operating parameter can be adjusted to account for drift immediately after starting up, or periodically. The process of starting operation in the field includes power up events after a power management operation. In embodiments where one component includes memory, steps can be taken prior to a power management operation using the communication channel, such as transferring calibration patterns to be used in calibration procedures.

Communication channel calibration with nonvolatile parameter store for recovery

An integrated circuit is described. The integrated circuit includes an interface circuit that includes a transmitter and a receiver. A generator in the integrated circuit is selectively coupled to the transmitter. The generator is to provide a test sequence that is output by the transmitter during a test mode of operation. A memory in the integrated circuit is selectively coupled to the generator and the receiver. The memory is to receive and synchronize the test sequence and a signal corresponding to the test sequence that is received by the receiver. A logic circuit in the integrated circuit is to compare the test sequence and the signal.

Self-test method for interface circuit

Interface test circuit

The present invention provides a method and apparatus configured to allow testing of interconnections between components in a system. The present invention utilizes a source of a known pattern, for example a pattern buffer, in a first component of the system and a capture buffer located in a second component of the system.

Method and apparatus for performing testing of interconnections

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Mountain View, CA, United States of America

Philip Yeung