Corning Incorporated

Corning Incotporated

Philip Robert LeBlanc

Correy Robert Ustanik

En Hong

Rajeshkannan Palanisamy

Chong Pyung An

Vitor Marino Schneider

Dale Alan Webb

Michael Albert Joseph, Ii

Uta-Barbara Goers

James Patrick Trice

Robert Arthur McIntosh

Sung-chan Hwang

Ji Hwa Jung

Tae-ho Keem

Sung-jong Pyo

Richard Hagan

Garrett Andrew Piech

Yuhui Jin

Joseph Henry Citriniti

Michal Mlejnek

Tian Huang

James Arthur Smith

Johannes Moll

Piotr Janusz Wesolowski

Douglas S Goodman

Richard Henry Weachock

David Joseph Kuhn

Michael Peter Gaj

Robert Arthur Mcintosh

Remy Tumbar

Amanda Kathryn Thomas

Hyeong-cheol Lee

Matthew Miacomet Winter Johnston

Apparatuses and methods are described for controlling the thickness of glass during glass sheet production. The apparatuses and methods employ a laser beam to heat a particular portion of the molten glass. In some examples, a laser beam control system controls the laser beam to generate a more consistent glass thickness across the glass sheet. In some examples, the laser beam control system multiplexes the laser beam to heat various portions of the glass, for example, simultaneously.

Energy delivery optimization for laser thickness control of fusion glass system and methods

A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.

Apparatus and method for inspecting laser defect inside of transparent material

A method for plugging a subset of cells of a honeycomb structure that includes: covering a first end face of the honeycomb structure with a mask that comprises a body and a plurality of openings, wherein the plurality of openings of the mask is coincident with a plurality of cells of the honeycomb structure; providing a plug of material upon a film material; applying a force to the film material to push the plug of material through the plurality of openings of the mask and into the plurality of cells of the honeycomb structure; and measuring a pressure within the plurality of cells during the applying step, wherein the applying step further comprises adjusting the force applied to the film material based at least in part on the pressure within the plurality of cells to push the plug of material to a predetermined depth within the plurality of cells.

Methods and apparatus for plugging cells of ceramic structures and honeycomb filters

Defect detection systems include at least one nozzle for delivering a COparticulate fluid to an inlet end of a plugged honeycomb body. Defects in the honeycomb, if any, are determined by monitoring COparticulate flow at the outlet end of the honeycomb body. Methods for detecting defects in plugged honeycomb bodies are also disclosed.

System and method for detecting defects in a honeycomb body

A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Method and apparatus for inspecting defects on transparent substrate and method emitting incident light

A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

Method and apparatus for inspecting defects on transparent substrate

A machine vision system for identifying optical fibers is provided that includes a support plate supporting one or more optical fibers. The one or more optical fibers each include a jacket. A light source is configured to emit light onto the one or more optical fibers. An imager is positioned above the light source. The imager is configured to receive reflected light from the light emitted onto the one or more optical fibers. A display system is configured to receive a signal from the imager and display an augmented image.

Multi-fiber identification using jacket color

A particle detection system includes a light source configured to emit a light beam into a cylindrical glass article when the cylindrical glass article is imaged by the glass particle detection system. The light beam is directed along a beam propagation axis that is perpendicular to a longitudinal axis of the cylindrical glass article. The particle detection system further includes a first polarizer positioned between the light source and the cylindrical glass, a camera configured to capture an image of the light beam reflected from the cylindrical glass article, and an analyzer positioned between the cylindrical glass article and the camera. An optical axis of the camera is perpendicular to the beam propagation axis of the light source.

Systems and methods for glass particle detection

A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.

Apparatus and methods for determining surface compliance for a glass surface

Disclosed is an apparatus and method for characterizing attributes of a moving glass sheet comprising complementary mechanical material handling technologies that progressively stabilize, position, capture, flatten, and release the lower portion of glass sheets traveling past the apparatus while posing minimal constraint on the top section of the sheet. The apparatus includes a pressure-vacuum (PV)-type device comprising distinct regions such that the glass sheets experience a non-contact but gradual increase in constraining force until the point where measurements can be performed, then a gradual decrease in constraining force until the glass sheets are released from the inspection station. This graduated force technique is applied along the direction of travel of the sheets and may also be applied vertically upwards along the height of the sheet to restrict the motion of the sheet without constraining it at pinch points near the conveyor.

Apparatus and method for characterizing glass sheets

A thickness of at least one preselected portion of a substrate, such as glass substrate for example, is controlled. A laser beam is directed to the at least one preselected portion of the substrate in a viscous state, thereby increasing a temperature and reducing a viscosity of the at least one preselected portion of the substrate in a viscous state sufficiently to cause the at least one preselected portion of the glass substrate to attain a desired thickness. The laser beam after it is generated can be directed to a reflecting surface from which the laser beam is reflected to the at least one preselected portion of the substrate in the viscous state. The substrate can comprise a glass ribbon produced in a downdraw glass forming process for example, and the laser beam can be directed onto a plurality of preselected portions of the glass ribbon.

Thickness control of substrates

Disclosed is an apparatus for characterizing attributes of a moving glass sheet comprising complementary mechanical material handling technologies that progressively stabilize, position, capture, flatten, and release the lower portion of glass sheets traveling past the apparatus while posing minimal constraint on the top section of the sheet. The apparatus includes a pressure-vacuum (PV)-type device comprising distinct regions such that the glass sheets experience a non-contact but gradual increase in constraining force until the point where measurements can be performed, then a gradual decrease in constraining force until the glass sheets are released from the inspection station. This graduated force technique is applied along the direction of travel of the sheets and may also be applied vertically upwards along the height of the sheet to restrict the motion of the sheet without constraining it at pinch points near the conveyor.

Disclosed are systems and methods for determining the shape of a glass sheet during and/or after the forming process. In one example, a system for determining the shape of a glass sheet defining an interior bulk can include a light source, an image capture device and a processor that are configured to calculate the location of an energy centroid within a selected portion of the bulk of the glass sheet.

Systems and methods for determining the shape of glass sheets

An apparatus for measuring surface topography of an object includes an optical arrangement capable of directing a first light beam at a surface of the object, providing a second light beam coherent with and spatially phase-shifted relative to the first light beam, and generating an interference beam from the second light beam and a reflection of the first light beam from the surface of the object. The apparatus further includes at least one line scan sensor for detecting and measuring the interference beam.

Apparatus and method for measuring surface topography of an object

A method of measuring the topography of a large, thin, non-flat specular substrate in a production environment with minimal movement of a majority of the measurement apparatus. A gimbal-mounted reflecting element is used to steer a short coherence length probe beam such that the probe beam is substantially perpendicular to a local surface of the substrate. The probe beam and the reference beam are combined and the resulting interference pattern used to characterize defects on the local surface.

Growing community of inventors

Corning, NY, United States of America

Philip Robert LeBlanc