Micron Technology Incorporated

Philip Neaves

Andrew M Lever

A system and method for providing capacitively-coupled signaling in a system-in-package (SiP) device is disclosed. In one embodiment, the system includes a first semiconductor device and an opposing second semiconductor device spaced apart from the first device, a dielectric layer interposed between the first device and the second device, a first conductive pad positioned in the first device, and a second conductive pad positioned in the second device that capacitively communicate signals from the second device to the first device. In another embodiment, a method of forming a SiP device includes forming a first pad on a surface of a first semiconductor device, forming a second pad on a surface of a second semiconductor device, and interposing a dielectric layer between the first semiconductor device and the second semiconductor device that separates the first conductive signal pad and the second conductive signal pad.

Structure and method for forming a capacitively coupled chip-to-chip signaling interface

A comparator with an input stage that selectively powers up an output stage provides an electronic device with a comparator that operates at low power. In an embodiment, an input stage produces a near decision and a true decision, where the near decision is provided to power up an output stage for the comparator to provide an output representative of the true decision.

Low power comparator

A bias readout circuit is disclosed for use in reading out a pixel of an imager system. The bias readout circuit includes a circuit portion which mirrors an output and bias transistor of a pixel to amplify an output signal produced by a pixel and increase the dynamic range of the pixel output.

Method and apparatus for improving pixel output swing in imager sensors

An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal terminals of the integrated circuit. The test plate is coupled to a test receiver circuit to receive and output the data signal detected at the test plate capacitively coupled to the signal terminals. Alternatively, the test plate is coupled to a test transmitter circuit to transmit data signals to signal terminals through the capacitively coupled test plate. A test unit can be coupled to the semiconductor device to evaluate the detected data signal against test criteria. Testing and evaluation is accomplished by capacitively coupling a test plate to a plurality of signal terminals. Data signals transmitted from a signal terminal and detected by the test plate or transmitted from the test plate and detected by the signal terminals are evaluated against a test criteria.

System and method for testing devices utilizing capacitively coupled signaling

A CMOS bandgap reference (BGR) voltage generator circuit has a passive resistor T-network of low resistance connected between the inverting and non-inverting inputs of the op-amp in the circuit. The op-amp's output is connected to the gates of three PMOS transistors and the drains of two of the transistors are connected in a looped manner to the input terminals of the op-amp. The T-network is placed between these drains that connect to the op-amp. Becuse of the rules governing abstracts, this abstract should not be used to construe the claims.

Bandgap reference circuit with a shared resistive network

A signal balancing circuit for capacitively coupled signaling between transmitting and receiving devices over a plurality of capacitively coupled signal lines on which data signals are transmitted from the transmitting device to the receiving device. The signal balancing circuit includes an encode circuit for forcing a signal transition of a data signal for a data interval in response to the data signal maintaining the same logic state throughout a respective time interval. A balancing signal is generated having a logic level and a timing relative to the time intervals of the respective data signals indicative of inversion of a particular data signal. A decode circuit coupled to the encode circuit to receive the balancing signal forces a transition of the transitioned signal at the appropriate time in accordance with the balance signal to recover the original logic level of the data signal.

System and method for balancing capacitively coupled signal lines

A CMOS bandgap reference (BGR) voltage generator circuit has a passive resistor T-network of low resistance connected between the inverting and non-inverting inputs of the op-amp in the circuit. The op-amp's output is connected to the gates of three PMOS transistors and the drains of two of the transistors are connected in a looped manner to the input terminals of the op-amp. The T-network is placed between these drains that connect to the op-amp.

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Surrey, United Kingdom

Philip Neaves