Growing community of inventors

Munich, Germany

Philip Diegmann

Average Co-Inventor Count = 1.22

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 2

Philip DiegmannChristian Heidler (1 patent)Philip DiegmannFerdinand Mayet (1 patent)Philip DiegmannStefan Diebenbusch (3 patents)Philip DiegmannJens Naumann (1 patent)Philip DiegmannVolker Ohlen (1 patent)Philip DiegmannJoel Woodward (1 patent)Philip DiegmannFriedrich Reich (1 patent)Philip DiegmannMoritz Pfefferkorn (1 patent)Philip DiegmannWolfgang Herbordt (1 patent)Philip DiegmannPhilipp Schreiber (1 patent)Philip DiegmannPhilip Diegmann (10 patents)Christian HeidlerChristian Heidler (25 patents)Ferdinand MayetFerdinand Mayet (3 patents)Stefan DiebenbuschStefan Diebenbusch (3 patents)Jens NaumannJens Naumann (2 patents)Volker OhlenVolker Ohlen (1 patent)Joel WoodwardJoel Woodward (1 patent)Friedrich ReichFriedrich Reich (1 patent)Moritz PfefferkornMoritz Pfefferkorn (1 patent)Wolfgang HerbordtWolfgang Herbordt (1 patent)Philipp SchreiberPhilipp Schreiber (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Rohde and Schwarz Gmbh & Co. Kg (9 from 1,455 patents)

2. Rhode & Schwarz Gmbh & Co. Kg (1 from 11 patents)


10 patents:

1. 12270833 - Oscilloscope post processing system, method and measurement device

2. 11946951 - Measurement device and method

3. 11293982 - Test method and test system

4. 11249115 - Electrical test and measurement device, measurement extension device as well as test and measurement system

5. 10991341 - Method for performing a bus autoset function and measurement device

6. 10976978 - Electrical measurement device and method

7. 10659201 - Method for assigning an input channel as well as signal analyzer

8. 10608916 - Measuring device and method for dynamically selecting a channel bandwidth

9. 10436827 - Measurement device and method for measuring the impedance of a device under test

10. 10330724 - Measurement arrangement

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