Growing community of inventors

Vancouver, Canada

Philip D Loewen

Average Co-Inventor Count = 5.25

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 2

Philip D LoewenJohan Backstrom (4 patents)Philip D LoewenMichael Forbes (4 patents)Philip D LoewenGuy A Dumont (4 patents)Philip D LoewenQiugang Lu (4 patents)Philip D LoewenR Bhushan Gopaluni (3 patents)Philip D LoewenGregory Edward Stewart (2 patents)Philip D LoewenBhushan Gopaluni (2 patents)Philip D LoewenNathan Lawrence (2 patents)Philip D LoewenBhusban Gopaluni (1 patent)Philip D LoewenLee D Rippon (1 patent)Philip D LoewenPhilip D Loewen (6 patents)Johan BackstromJohan Backstrom (28 patents)Michael ForbesMichael Forbes (16 patents)Guy A DumontGuy A Dumont (15 patents)Qiugang LuQiugang Lu (4 patents)R Bhushan GopaluniR Bhushan Gopaluni (3 patents)Gregory Edward StewartGregory Edward Stewart (51 patents)Bhushan GopaluniBhushan Gopaluni (2 patents)Nathan LawrenceNathan Lawrence (2 patents)Bhusban GopaluniBhusban Gopaluni (1 patent)Lee D RipponLee D Rippon (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Honeywell G.m.b.h. (4 from 3,645 patents)

2. Honeywell International Inc. (2 from 15,608 patents)


6 patents:

1. 11500337 - Method and system for directly tuning PID parameters using a simplified actor-critic approach to reinforcement learning

2. 11449046 - Model-plant mismatch detection with support vector machine for cross-directional process behavior monitoring

3. 11307562 - Application of simple random search approach for reinforcement learning to controller tuning parameters

4. 10809674 - Model-plant mismatch detection using model parameter data clustering for paper machines or other systems

5. 10761522 - Closed-loop model parameter identification techniques for industrial model-based process controllers

6. 10459428 - Optimal closed-loop input design for identification of flat-sheet process models

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