Western Digital Technologies, Inc.

Philip Bernard Saram

Dean V Dang

Colin W Morgan

Jonas Andrew Goode

Donald Joseph Brunnett

Petrus Hu

Hasni Zaidy Abdul Hamid

Robert S Cohn

Kamalam P Elayappan

William J Seamon

Kek Ming Chua

Theen-Leong Fong

William Chong

Muhammad Nur Syukri Bin Ahmad Shukor

Syaiful Hazli Hamdan

Chakrit Choosang

A hard disk drive assembly (HDA) operable with a host computer that comprises a printed circuit board assembly (PCBA) including a system on a chip (SOC). The HDA including a plurality of disks configured to store data, a plurality of heads configured to read and write data stored on the plurality of disks, a flex circuit board including a preamplifier, and configured to couple to the plurality of heads and the SOC, a flex circuit cable coupled to the flex circuit board, and a non-volatile semiconductor memory (NVSM) located in the HDA. The NVSM is configured to store configuration data for read and write operations of the HDA, wherein the configuration data is to be retrieved by the SOC for controlling the read and write operations of the HDA, and the NVSM is coupled to at least one of the flex circuit cable, the flex circuit board, or the preamplifier.

Hard disk drive assembly including a NVSM to store configuration data for controlling disk drive operations

A disk drive is disclosed comprising a disk comprising a plurality of tracks, and a head actuated over the disk. One of the tracks is read to generate a read signal, and a noise signal is injected into the read signal to generate a noisy read signal. An off-track read capability (OTRC) is measured based on the noisy read signal, and a parameter of the disk drive is adjusted based on the OTRC.

Disk drive calibrating parameter by injecting noise signal and measuring off-track read capability

Disclosed is a disk drive that is operable with a host computer that includes a printed circuit board assembly (PCBA) having a system on a chip (SOC). The disk drive comprises: a hard disk drive assembly (HDA); and a non-volatile semiconductor memory (NVSM). The NVSM is located in the HDA and is couplable to the SOC of the host computer. The NVSM is configured to store configuration data for disk drive operation. The configuration data is configured to be retrieved by the SOC for controlling disk drive operations.

A disk drive is disclosed that enables defect margining during disk drive burn-in testing. The disk drive comprises: a disk comprising a plurality of tracks; a head actuated over the disk; and a processor. The processor is configured to: perform disk drive burn-in testing to detect media defects; generate an initial defect list based upon detected media defects for sectors; generate an extended defect list that includes detected media defects and extended defect margins from the detected media defects; and utilize the extended defect list for burn-in, wherein a spare area of the disk allows for the detected media defects and the extended defect margins.

Disk drive to enable defect margining

Defects are identified in a disk drive by first writing a pattern of tracks to a disk surface in the disk drive, the pattern of tracks including written tracks alternating with unwritten tracks. The written tracks of the pattern of tracks are read, and a defect in a portion of a first written track is detected. An unread portion of a first unwritten track is then identified as comprising a defect based at least in part on the defect in the first written track, the first unwritten track located proximate the first written track.

Method of alternating track write for defect identification

A disk drive is disclosed comprising a disk having top and bottom surfaces, and top and bottom heads actuated over the top and bottom surfaces, respectively. Control circuitry detects a warping of the disk by writing a first test pattern to the top surface, reading the first test pattern to generate a first read signal, monitoring a first read signal value proportional to an amplitude of the first read signal, writing a second test pattern to the bottom surface, reading the second test pattern to generate a second read signal, monitoring a second read signal value proportional to an amplitude of the second read signal, and processing the first and second read signal values to detect a negative correlation between the amplitudes of the first and second read signals.

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Kuala Lumpur, Malaysia

Philip Bernard Saram