Micro Control Company

Philip Alan Bailey

Kevin Roland Deters

A burn-in system includes a testing stage configured to stress test one an integrated circuit and a power stage having a voltage control mode and a current control mode. The power stage is configured to supply power to the testing stage. One embodiment of the power stage includes a pulse width modulator, a current control circuit and a voltage control circuit. The pulse width modulator is configured to generate a modulated power output that is coupled to the testing stage. The current control circuit is configured to produce a current error output signal that is based on a difference between a measured load current, which is indicative of the current that is supplied to the testing stage by the modulated power output, and target load current. The voltage control circuit is configured to produce a voltage error output signal that is based on a difference between a measured load voltage, which is indicative of the voltage across a load of the testing stage, and a target load voltage when the power stage is in the voltage control mode. The voltage control circuit is further configured to produce the voltage error output signal that is based on the current error output signal when the power stage is in the current control mode. The modulated power output is based on the voltage error output signal.

Burn-in system power stage

A burn-in system includes single and dual power modes, a testing stage, first and second power stages, a single mode power control circuit and a dual mode power control circuit. When the burn-in system is in the single power mode, the first power stage produces a first power output to the testing stage based on a single mode error signal generated by the single mode power control circuit. When the burn-in system is in the dual power mode the first power stage produces the first power output and the second power stage produces a second power output in response to a dual mode error signal produced by the dual mode power control circuit. The first and second power outputs are coupled together when the burn-in system is in the dual power mode. In one embodiment, the first and second power stages each include a pulse width modulator controller that receives one of the error signals produced by the single mode and dual mode power control circuits depending on the power mode of the burn-in system, and controls the first and second power outputs accordingly.

Burn-in system having multiple power modes

A test signal generating system for providing test signals to electronic circuit components under test in a burn-in system, the test signal generating system having a timing arrangement for eliminating glitches from the test signals, The test signal generating system comprises a data generator, a timing generator and a format selector, each of which provides an input signal to a test signal selector, A first, second and third flip-flop are electrically connected to the data generator, timing generator and format selector, respectively. A fourth flip-flop is electrically connected to an output of the test signal selection means, Each of the flip-flops is triggered by the same clock.

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Marine on St. Croix, MN, United States of America

Philip Alan Bailey