Panalytical B.v.

Malvern Panalytical B.v.

Petronella Emerentiana Hegeman

Frederik Bijkerk

Gustaaf Christian Brons

Waltherus W Van Den Hoogenhof

Charalampos Zarkadas

Milen Gateshki

Alexander Kharchenko

Robert Van Der Meer

Bruno A R Vrebos

Harry Berkhoff

Gert Van Dorssen

Dick Kuiper

Aleksandr Komelkov

Gustaaf Christian Simon Brons

Waltherus Van Den Hoogenhof

Alexander Karchenko

An X-ray tube according to the present invention comprises an anode and a cathode comprising an emission portion for emitting an electron beam. The emission portion is configured to irradiate a target surface of the anode with electrons to cause the anode to emit X-rays. A window is arranged at an end of the X-ray tube, to allow X-rays to exit the X-ray tube. The target surface of the anode is inclined at an oblique angle with respect to a longitudinal axis, wherein the longitudinal axis passes through the end of the X-ray tube.

X-ray tube and X-ray analysis system

X ray apparatus includes a sample stage () for supporting a sample (), an X-ray source () and an energy dispersive X-ray detector (). A conical X-ray collimator () is provided either between the sample and the X-ray source or between the sample and the energy-dispersive X-ray detector, the conical X-ray collimator including a plurality of truncated cones arranged concentrically around a central axis, the truncated cones having a common apex defining a central measurement spot on the sample.

Conical collimator for X-ray measurements

Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle &#x3c8;to the surface of the sample and measuring a measured intensity I(&#x3b8;) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle &#x3c8;corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.

Quantitative X-ray analysis&#x2014;matrix thickness correction

Apparatus includes an X-ray source, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detectoragain for measuring X-ray fluorescence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.

Quantitative X-ray analysis&#x2014;multi optical path instrument

The invention relates to a device for performing X-ray analysis. Devicecomprises an X-ray tubeand at least one capillary lensfor focusing the X-rays in a micro-region at a locationfor a sample for analysis. Devicefurther comprises a detectorfor detecting X-ray fluorescence from the sample. Devicefurther comprises at least one energy-dependent filterplaced between the X-ray tubeand the capillary lens. The filteris adapted to substantially block X-rays with an energy which is lower than a predetermined threshold value.

Device and method for performing X-ray analysis

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Almelo, Netherlands

Petronella Emerentiana Hegeman