Siemens Aktiengesellschaft

Hewlett-packard Corporation

Peter Wojtalla

Peter Voss

Thomas Wagner

Erhard Lehmann

Franz Stegerer

Johann Breu

Otto Voggenreiter

Walter Juri

Mee-Moi Yap

Leon Masseus

Ludwig Pirkl

A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter.

Test procedure and test station for carrying out the test procedure

Circuit arrangement for reducing recovery time of a thyristor having a control electrode, a main emitter electrode and at least one auxiliary emitter electrode disposed between the main emitter electrode and the control electrode, includes two current sources, one of which delivers a pulse of one polarity and is connected to and between the control electrode and the auxiliary emitter electrode, and the other of which delivers a pulse of the other polarity and is connected to and between the auxiliary emitter electrode and the main emitter electrode.

Circuit arrangement for reducing the recovery time of a thyristor

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Langenpreising, Germany

Peter Wojtalla