Hewlett Packard Enterprise Development LP

Peter Tsugio Kurahashi

Dacheng Zhou

Michael James Marshall

Ryan Barnhill

A TI-ADC circuit and method therefor include the use of first and second level clock generators configured to receive an asynchronous reference clock signal and generate a plurality of first and second clock signals, the second level clock generator including a plurality of clock dividers connected in series, respective ones of the plurality of clock dividers being configured to divide an input clock signal in accordance with a synchronization signal; a plurality of T/H circuits respectively configured to operate in accordance with one of the first clock signals; a plurality of sub-ADCs respectively configured to operate in accordance with one of the second clock signals, thereby to sample an input signal in a time-interleaved manner, wherein for a given clock divider of the plurality of clock dividers, the synchronization signal corresponds to an output clock of a clock divider immediately upstream from the given clock divider.

Clock synchronization in time-interleaved analog-to-digital conversion

A frontend circuit of a time-interleaved ADC is provided. The frontend circuit can include a track-and-hold circuit to sample an analog input signal to the ADC, a sub-ADC circuit to convert the sampled analog input signal to a digital output signal, and a source-follower circuit. An input of the source-follower circuit can be coupled to an output of the track-and-hold circuit, and an output of the source-follower circuit can be coupled to an input of the sub-ADC circuit. The source-follower circuit is to provide buffering between the track-and-hold circuit and the sub-ADC circuit. The circuit further includes a common-mode-adjusting circuit to dynamically adjust common-mode settings of the time-interleaved ADC. While adjusting the common-mode settings, the common-mode-adjusting circuit can adjust, separately, an input common-mode voltage of the track-and-hold circuit and an input common-mode voltage of the sub-ADC circuit based on current Process, Voltage, and Temperature (PVT) conditions.

Method and system for improving analog-to-digital conversion performance

Systems and methods are provided for a pipelined analog-to-digital converter (ADC) circuit. The pipelined ADC circuit comprises a plurality of stages. Each stage comprises a differential input configured to receive a differential signal, a multiplying digital-to-analog converter (MDAC) electrically coupled to the input configured to stack voltages of a set of capacitors; a comparator electrically disposed after the MDAC to compare the differential voltages; and a source follower buffer electrically coupled to the first signal line and the second signal line and electrically disposed after the comparator, wherein the MDAC is configured to amplify an output voltage using passive multiplication; and an alignment circuit communicatively connected to a digital bit output of each stage of the plurality of stages, wherein the alignment circuit is configured to delay a digital bit output of each stage for one or more clock cycles and output a digitized representation of a sampled differential signal.

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Fort Collins, CO, United States of America

Peter Tsugio Kurahashi