Witec Wissenschaftliche Instrumente Und Technologie Gmbh

Witec Wissenchaftliche Instrumente Und Technologie Gmbh

Peter Spizig

Olaf Hollricher

Gerhard Volswinkler

Detlef Sanchen

Othmar Marti

Joachim Koenen

Wolfram Ibach

Jörg Förstner

Wofram Ibach

Detief Sanchen

A method and a device are provided which enables a simple and fast Raman and/or fluorescence measurement even on uneven specimen surfaces; additionally, the invention should make it possible to confocally image a plane or a surface, in particular a surface of a specimen, i.e. with the aid of confocal microscopy.

Method and device for imaging a specimen surface

A device for imaging the surfaces of a sample having topography with the aid of confocal microscopy, in particular confocal Raman and/or fluorescence microscopy, comprising a first light source, in particular a laser light source for generating excitation radiation, in particular Raman radiation and/or fluorescence radiation and a second light source, wherein the first laser light source emits radiation in a first wavelength range and the second light source emits radiation in a second wavelength range, wherein the first wavelength range and the second wavelength range do not overlap.

Device for imaging a sample surface

The invention relates to an apparatus and a method for imaging surface area of a sample having a surface topography with the aid of confocal microscopy, such as confocal Raman and/or fluorescence microscopy. The apparatus comprises a surface topography sensor that provides values for the surface topography. The surface topography values allow for the surface to be maintained in the confocal plane during scanning.

Apparatus for imaging a sample surface

A microscope, in particular a scanning probe microscope, comprising a programmable logic device.

Scanning probe in pulsed-force mode, digital and in real time

Microscope, in particular a scanning probe microscope, comprising a programmable logic device.

The invention relates to a method for creating the image of a sample surface to be analyzed, with a resolution which is better than 1 &#x3bc;m laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitized using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device. One or several characteristic variables of the force-time curves are determined for each scanning point from the real-time evaluation results and the stored digitized force-time curves and an image of the sample surface is obtained from said characteristic variables of the scanning points.

Growing community of inventors

Niederstotzingen, Germany

Peter Spizig